2019
DOI: 10.1186/s42649-019-0018-0
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Microscopic study of zinc nanoparticles synthesised using thermosetting polymer

Abstract: The present study reports the novel synthesis of Zinc nanoparticles (Zn NPs) by thermal decomposition method and its characterisation by Scanning Electron Microscope (SEM), Transmission Electron Microscope (TEM), and X-ray Diffraction Measurements (XRD). Synthesis of Zn NPs was achieved by using thermosetting polymer and zinc salts as precursor. Zn NPs were obtained on calcination at 850°C for 30 min. SEM study reveals that synthesized nanoparticles are spherical in shape. XRD analysis shows that the Zn NPs fo… Show more

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Cited by 12 publications
(5 citation statements)
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“…Also, the broad XRD peak at the 2θ angles from 20˚ to 30˚ establishes that ZnO NPs are low-crystalline. These outcomes match primarily in agreement with the literature [11,12].…”
Section: X-ray Diffractionsupporting
confidence: 91%
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“…Also, the broad XRD peak at the 2θ angles from 20˚ to 30˚ establishes that ZnO NPs are low-crystalline. These outcomes match primarily in agreement with the literature [11,12].…”
Section: X-ray Diffractionsupporting
confidence: 91%
“…TEM analysis confirms that the primary structure of the Zn/ZnO NPs is the Core/Shell. These outcomes match primarily in agreement with the literature [7,9,11,13,14].…”
Section: Transmission Electron Microscopesupporting
confidence: 91%
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“…The imaging was done under a high vacuum, and 15KV accelerating voltage was used to get a high‐resolution image. This SEM analysis was carried out using a Bruker Nano GmbH machine at different magnifications where X1000 and X5000 magnification (Tailor et al, 2019). For EDX analysis, the mode was changed from SEM to EDX in the systems.…”
Section: Methodsmentioning
confidence: 99%
“…Aliquots were taken for analyzing the UV–vis spectra at time intervals of 24 h. The UV–vis spectra were analyzed within the range of 200–1,000 nm. Transmission electron microscopy was performed for analyzing the dimension and size of the ZnO NPs (Tailor et al, 2019 ; Bharadwaj et al, 2021 ). An X-ray diffractometer is used for the purpose of analyzing crystalline phase and purity between 20° and 80°.…”
Section: Artificial Neural Network (Ann) Teaching-learning Based Opti...mentioning
confidence: 99%