Microscopic Order Parameter of Two Nematogenic Compounds using X-Rays

Gopalakrishna, Deepak; Revannasiddaiah, D.; Somashekar, R.

doi:10.1080/15421400590956973

Cited by 1 publication

(1 citation statement)

References 13 publications

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“…This expression readily enables the order parameters, hP L i, to be determined from the integrated intensity of the wide-angle X-ray peaks, the method for which is described fully in the literature [23]. As a result of the increasing ease of carrying out X-ray scattering studies of liquid crystal samples, this method has been used widely in the field of liquid crystal studies to interpret experimental data [ 14,15,17,[24][25][26][27][28][29][30][31][32][33][34][35], as well as forming the basis for a number of computational and theoretical studies [36][37][38][39]. Outside the field of liquid crystals, it was noted over a decade ago by Burger and Ruland that there had been an error in the derivation of Equation (4) [40], and that the correct formula had in fact been derived much earlier by Kratky [41].…”

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confidence: 99%

Considerations in the determination of orientational order parameters from X-ray scattering experiments

et al. 2018

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An assessment of the data processing and analysis methods used to obtain the second-and fourth-rank orientational order parameters of liquid crystals from X-ray scattering experiments has been carried out, using experimental data from four extensively studied alkylcyanobiphenyls and calculated data generated from two general types of theoretical orientational distribution function. The application of a background subtraction and two different baseline correction methods to the scattering profiles is assessed, along with three different methods to analyse the processed data. The choice of baseline correction method is shown to have a significant effect: an offset to zero overestimates the order parameters from the experimental and calculated data sets, particularly for lower order parameters arising from broad distributions, whereas an offset to a value estimated from regions of low scattering intensity provides experimental values close to those reported from other experimental techniques. By contrast, the three different analysis methods are shown generally to result in relatively small absolute differences between the order parameters. We outline a straightforward general approach to experimental X-ray scattering data processing and analysis for uniaxial phases that results in order parameters that match well with those reported using other experimental techniques.

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