Microscopic optoelectronic defectoscopy of solar cells

Abstract

Abstract. Scanning probe microscopes are powerful tool for micro-or nanoscale diagnostics of defects in crystalline silicon solar cells. Solar cell is a large p-n junction semiconductor device. Its quality is strongly damaged by the presence of defects. If the cell works under low reverse-biased voltage, defects emit a light in visible range. The suggested method combines three different measurements: electric noise measurement, local topography and near-field optical beam induced current and thus provides more complex information. To prove its feasibility, we have selected one defect (truncated pyramid) in the sample, which emitted light under low reverse-biased voltage.

Design and Implementation of a Solar Tree Structure for Efficient LED Street Lighting

“…It is considered as one of the main sources of renewable energy in future. Solar technologies are broadly portrayed as either passive solar or active solar relying upon the manner in which they catch, convert and disperse solar energy [3].…”