Abstract:In this paper, we report that the beam profile of the near-infrared light from superluminescent diodes (SLDs) can be measured with a resolution below the diffraction limit by using the photothermal effect and scanning thermal microscopy (SThM). Due to the sub-diffraction resolution of SThM, the beam profile measured using SThM was much clearer than the beam profile obtained by using the knife-edge method. By stacking cross-sectional images of the optical beam profile obtained by using SThM, we were able to obt… Show more
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