Microscopic Insights into the Sputtering of Thin Organic Films on Ag{111} Induced by C<sub>60</sub> and Ga Bombardment

Postawa, Zbigniew; Czerwinski, Bartlomiej; Winograd, Nicholas; Garrison, Barbara J.

doi:10.1021/jp050821w

Cited by 84 publications

(99 citation statements)

References 51 publications

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“…This might be because the Cs + projectile is not sufficiently large and energetic to eject the silver ions. This result is consistent with that from the molecular dynamics simulation of the Ga + bombardment reported previously [11,12]. In addition, each carbon atom on C 60 + impact cannot be embedded into the silver substrate and interacts strongly with the polymer overlayer because the carbon atoms are easily deflected by silver atoms.…”

Section: Resultssupporting

confidence: 91%

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Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

Moon

Wells

Gardella

2011

J. Am. Soc. Mass Spectrom.

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This study reports the characteristic fragmentation patterns from two polysiloxane polymers that form ordered overlayer on silver substrates. Results are compared for the bombardment of various monatomic and polyatomic projectiles of Cs + , C 60 + (10 keV), Bi 1 + , and Bi 3 + (25 keV) in the high mass range time-of-flight secondary ion mass spectrometry (TOF-SIMS) spectra.Results are reported from sub-monolayer (solution cast) coverages of poly(dimethylsiloxane)s with the number average molecular weights (M n ) of 2200 and 6140 Da, respectively, and Langmuir-Blodgett monolayers of poly(methylphenylsiloxane) with molecular weights (MW) from 600 and 1000 Da. For each film, Bi projectiles resulted in the emission of positive silver cluster ions from the substrate under the polymer overlayer and peaks corresponding to silver cluster ions with larger mass were observed by impact of polyatomic 25 keV Bi 3 + projectiles. In addition, depending on the change of energy of Bi 3 + , a different pattern of fragments was observed. With Cs + and C 60 + impact, however, the emission of silver cluster ions was not detected. In the case of C 60 + impact for PDMS-6140, peaks corresponding to silver-cationized intact oligomers were not observed. In this paper, these results are explained by the possible bombardment mechanism for each projectile, based on its mass, energy, and split trajectories of the component atoms under the polyatomic impact.

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Section: Resultssupporting

confidence: 91%

“…The mechanism of ion formation under cluster ion bombardment has yet to be completely explained. Theoretical and experimental studies, however, have shown the increased yield results from an overlap of low energy impact cascades of individual atomic components of cluster ions [10][11][12][13][14].…”

Section: Introductionmentioning

confidence: 99%

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

Moon

Wells

Gardella

2011

J. Am. Soc. Mass Spectrom.

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“…Note that the AA and DMPA maximum and minimum signal intensities remain nearly constant. The conservation of these molecular ion signals indicates that the ion bombardment does not create significant damage to the underneath layers, a result which is predicted by many molecular dynamics computer simulations of the bombardment process [10,28,29]. In sum- Figure 2. (a) Optical image of LB20 film with a crater in the middle which is created after C 60 ϩ depth profiling (the crater is the grey area, which is surrounded by blue uneroded area); (b) AFM measurements of LB20 films with a crater which is formed by C 60 ϩ depth profiling.…”

Section: Characterization Of Lb Films By Simsmentioning

confidence: 78%

Chemically alternating langmuir-blodgett thin films as a model for molecular depth profiling by mass spectrometry

Zheng

Wucher

Winograd

2008

J. Am. Soc. Mass Spectrom.

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Langmuir-Blodgett multilayers of alternating barium arachidate and barium dimyristoyl phosphatidate are characterized by secondary ion mass spectrometry employing a 40 keV buckminsterfullerene (C 60 ) ion source. These films exhibit well-defined structures with minimal chemical mixing between layers, making them an intriguing platform to study fundamental issues associated with molecular depth profiling. The experiments were performed using three different substrates of 306 nm, 177 nm, and 90 nm in thickness, each containing six subunits with alternating chemistry. The molecular subunits are successfully resolved for the 306 nm and 177 nm films by cluster ion depth profiling at cryogenic temperatures. In the depth profile, very little degradation was found for the molecular ion signal of the underneath layers compared with that of the top layer, indicating that the formation of chemical damage is removed as rapidly as it is formed. The resolving power decreases as the thickness of the alternating subunits decrease, allowing a depth resolution of 20 to 25 nm to be achieved. The results show the potential of LB films as an experimental model system for studying fundamental features of molecular depth profiling. (J Am Soc Mass Spectrom 2008, 19, 96 -102)

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“…Classical molecular dynamics (CMD) simulation has been performed to model ion sputtering of solids including metals [3] and organic thin films on inorganic substrates [4,5]. In these CMD simulations the damage to solid surface was made more reduction by cluster ion bombardments than by mono-atomic ion bombardments.…”

Section: Introductionmentioning

confidence: 99%

Simulation of Fragmentation of Polyethylene Glycol by Quantum Molecular Dynamics for TOF-SIMS Spectral Analysis

Kato

Kudo

2011

JSA

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For detail analysis of fragmentation of organic molecules in TOF-SIMS spectra, fragmentation process of a polyethylene glycol (PEG) was simulated by using Quantum Molecular Dynamics method. In the simulation, fragmentation process of the PEG model was assumed as thermal decomposition. Initial thermal energies given to the model were 20 ∼ 90 eV at every 10 eV step, and the energies were relaxed to 1.5 eV by using Brendsen method. Simulation results of the mass spectra for PEG model were in considerably good accordance with experimental ones of PEG in TOF-SIMS.

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Microscopic Insights into the Sputtering of Thin Organic Films on Ag{111} Induced by C₆₀ and Ga Bombardment

Cited by 84 publications

References 51 publications

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

Chemically alternating langmuir-blodgett thin films as a model for molecular depth profiling by mass spectrometry

Simulation of Fragmentation of Polyethylene Glycol by Quantum Molecular Dynamics for TOF-SIMS Spectral Analysis

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Microscopic Insights into the Sputtering of Thin Organic Films on Ag{111} Induced by C60 and Ga Bombardment

Cited by 84 publications

References 51 publications

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

Characteristic Fragmentation of Polysiloxane Monolayer Films by Bombardment with Monatomic and Polyatomic Primary Ions in TOF-SIMS

Chemically alternating langmuir-blodgett thin films as a model for molecular depth profiling by mass spectrometry

Simulation of Fragmentation of Polyethylene Glycol by Quantum Molecular Dynamics for TOF-SIMS Spectral Analysis

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Microscopic Insights into the Sputtering of Thin Organic Films on Ag{111} Induced by C₆₀ and Ga Bombardment