Microscopic dynamics in nanocomposite photosensitive films studied by X-ray photon correlation spectroscopy

Orsi, Davide; Cristofolini, Luigi; Fontana, Marco; Pontecorvo, E.; Caronna, Chiara; Fluerasu, Andrei; Zontone, Federico; Madsen, Anders

doi:10.1080/14786435.2010.524899

Cited by 4 publications

(2 citation statements)

References 27 publications

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“…These authors subsequently studied with XPCS the same system with gold nanoparticles embedded in the film . In this case the scattering is dominated by that from the gold nanoparticles, which as discussed for other systems previously, acts as nano‐rheological probes of the dynamics of the system.…”

Section: Recent Studies Using Xpcssupporting

confidence: 84%

X‐ray Photon Correlation Spectroscopy Studies of Surfaces and Thin Films

2014

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The technique of X-ray Photon Correlation Spectroscopy (XPCS) is reviewed as a method for studying the relatively slow dynamics of materials on time scales ranging from microseconds to thousands of seconds and length scales ranging from microns down to nanometers. We focus on the application of this technique to study dynamical fluctuations of surfaces, interfaces and thin films. We first discuss instrumental issues such as the effects of partial coherence (or alternatively finite instrumental resolution) and optimization of signal-to-noise ratios in the experiments. We then review what has been learned from recent XPCS studies of capillary wave fluctuations on liquid surfaces and polymer films, of nanoparticles used as probes to study the interior dynamics of polymer films, of liquid crystals and multilamellar surfactant films, and of metal surfaces, and magnetic domain wall fluctuations in antiferromagnets. We then discuss studies of non-equilibrium dynamics described by 2-time correlation functions. Finally, we briefly speculate on possible future XPCS experiments at new synchrotron sources currently under development including studies of dynamics on time scales down to femtoseconds.

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Section: Recent Studies Using Xpcssupporting

confidence: 84%

X‐ray Photon Correlation Spectroscopy Studies of Surfaces and Thin Films

2014

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“…X-ray photon correlation spectroscopy (XPCS) using the partial coherence of radiation emitted by third generation synchrotron sources is a powerful method to investigate slow processes in soft matter such as colloidal suspensions [18][19][20], gels [21,22], or polymers [23][24][25]. XPCS is not affected by multiple scattering or opacity for visible light.…”

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confidence: 99%

Direction Dependent Diffusion of Aligned Magnetic Rods by Means of X-Ray Photon Correlation Spectroscopy

et al. 2013

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Rodlike hematite particles in suspension align perpendicular to an external magnetic field due to a negative anisotropy of their magnetic susceptibility Á. The diffusion tensor consists of two principal constants D k and D ? for the diffusion parallel and perpendicular to the long particle axis. X-ray photon correlation spectroscopy is capable of probing the diffusive motion in optically opaque suspensions of rodlike hematite particles parallel to the direction of the scattering vector Q. Choosing Q parallel or perpendicular to the direction of an external magnetic field H the direction dependent intermediate scattering function is measured by means of x-ray photon correlation spectroscopy. From the intermediate scattering function in both directions the principal diffusion constants D k and D ? are determined. The ratio D k =D ? increases with increasing aspect ratio of the particles and can be described via a rescaled theoretical approach for prolate ellipsoids of revolution.

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Synchrotron X-ray techniques for the investigation of structures and dynamics in interfacial systems

Cristofolini

2014

Current Opinion in Colloid & Interface Science

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Microscopic dynamics in nanocomposite photosensitive films studied by X-ray photon correlation spectroscopy

Cited by 4 publications

References 27 publications

X‐ray Photon Correlation Spectroscopy Studies of Surfaces and Thin Films

X‐ray Photon Correlation Spectroscopy Studies of Surfaces and Thin Films

Direction Dependent Diffusion of Aligned Magnetic Rods by Means of X-Ray Photon Correlation Spectroscopy

Synchrotron X-ray techniques for the investigation of structures and dynamics in interfacial systems

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