2009
DOI: 10.1063/1.3266677
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Micropipe absorption mechanism of pore growth at foreign polytype boundaries in SiC crystals

Abstract: Formation of pores at foreign polytype boundaries in bulk SiC crystals is studied by means of synchrotron radiation phase-sensitive radiography, optical and scanning electron microscopies, and color photoluminescence. It is demonstrated that pores are formed through coalescence of micropipes and extend along the polytype boundaries by means of micropipe absorption. A theoretical model is suggested, which describes the micropipe absorption by an elliptic pore nucleated at the boundary of a foreign polytype incl… Show more

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Cited by 12 publications
(18 citation statements)
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“…By effectively accommodating both the dilatation and orientation misfits between FPI and matrix, these pores in early stages can attract additional random full-core dislocations and MPs from neighboring regions (Fig. 4), as earlier described in detail [13]. In such a way, the interface pores can extend along FPI boundaries and accumulate dislocation charge that is the resulting Burgers vector of all the dislocations absorbed by the pore.…”
Section: Generation Of Pores In Early Stage Of Sic Growthmentioning
confidence: 83%
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“…By effectively accommodating both the dilatation and orientation misfits between FPI and matrix, these pores in early stages can attract additional random full-core dislocations and MPs from neighboring regions (Fig. 4), as earlier described in detail [13]. In such a way, the interface pores can extend along FPI boundaries and accumulate dislocation charge that is the resulting Burgers vector of all the dislocations absorbed by the pore.…”
Section: Generation Of Pores In Early Stage Of Sic Growthmentioning
confidence: 83%
“…3(a) demonstrates that the groups of pores (marked by black and white arrows) consist of short tube-shaped or slit-like segments. The morphology of such pores was investigated and attributed to the elastic interaction between MPs and boundaries of FPIs, resulting in coalescence of MPs into larger pores elongated along the boundaries [11,13]. FPIs were indeed observed on the same location, as revealed by the yellow PL images [28] of n-type 4H-SiC containing N and B in Fig.…”
Section: The Evolution Of Defects During Sic Growthmentioning
confidence: 87%
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