1997
DOI: 10.1063/1.364884
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Micromagnetic simulations with eddy currents of rise time in thin film write heads

Abstract: A dynamic micromagnetic model which includes gyromagnetic effects (via the Landau–Lifshitz equation) and eddy currents has been developed and applied to the rise time problem in thin film write heads. A cross-section of the part of the head covering the coils is simulated with this model, while the rest of the head is modeled as saturable reluctances. The reluctances do not include eddy currents, but they do include leakage, fringing and saturation, and allow for computation of the deep gap field. This model i… Show more

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Cited by 23 publications
(9 citation statements)
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“…A recently developed dynamic micromagnetic model by Sandler and Bertram [2] combines gyromagnetic effects and eddy currents, and is applied to the rise time problem in thin film write heads. Here we employ their approach to calculate the flux rise time as a function of yoke length.…”
Section: A Backgroundmentioning
confidence: 99%
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“…A recently developed dynamic micromagnetic model by Sandler and Bertram [2] combines gyromagnetic effects and eddy currents, and is applied to the rise time problem in thin film write heads. Here we employ their approach to calculate the flux rise time as a function of yoke length.…”
Section: A Backgroundmentioning
confidence: 99%
“…The simulated head consists of tip, neck, and yoke regions as described in [2]. The yoke is modeled micro-magnetically, but the neck and tip regions are modeled with an equivalent 2 d, =(2n-1) i + j i w 6 (2) where pcL, is the intrinsic peameability, w and t stand for the cross section of a slab, 6 is the skin depth.…”
Section: B Descriptionmentioning
confidence: 99%
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“…Several studies on possible limitations on the data rate have been performed in the past years. They include works on the switching speed of the media [4], [5], fast writers [6], [7], as well as on the gyromagnetic effects and how they affect the speed at which the data can be retrieved [8]. Little attention has been paid to the effects of parasitic capacitance coupling through various head components.…”
Section: Introductionmentioning
confidence: 98%