Micromagnetic simulation of exploratory magnetic logic device with missing corner defect

Yang, Xiaokuo; Cai, Li; Zhang, Bin; Cui, Huanqing; Zhang, Mingliang

doi:10.1016/j.jmmm.2015.06.068

Cited by 10 publications

(5 citation statements)

References 16 publications

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“…Niemier et al proposed a dual input AND/OR logic gate using a nanomagnet with slanted edge, increasing the efficiency and accuracy of NML [4]. However, the nanomagnets of this structure are asymmetrical in shape and have three disadvantages: 1) This type of nanomagnet requires a larger size, thus increasing the NML space and introducing clock errors of the C-shape and eddy current that are easily occur in large-sized nanomagnets [5][6][7]. 2) Complex calculations caused by the irregular shape are inevitable.…”

Section: Introductionmentioning

confidence: 99%

Design of NAND/NOR Logic Gate Clocked by Voltage-generated Stress

Yang¹,

Wei²,

Li³

2019

dtetr

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By using the preferred magnetization of clock-tilted nanomagnet, we propose a design of NAND/NOR magnetic logic gates clocked by voltage-generated stress. Unlike designs based on slanted nanomagnet, our design uses regular-shaped nanomagnets, allowing high ratio (2:1) of the nanomagnets to be used. It can eliminate C-shaped and eddy current clock errors, and reduce the complexities of fabrication process. In addition, our design consumes only one-tenth the energy of general designs using a spintronics clock.

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Section: Introductionmentioning

confidence: 99%

Design of NAND/NOR Logic Gate Clocked by Voltage-generated Stress

Yang¹,

Wei²,

Li³

2019

dtetr

Self Cite

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“…Nowadays, intense research effort is focused on exploring alternative emerging devices beyond CMOS to perform a binary logical function [1] and special computational operation [2] . One promising device technology type among them is nanomagnetics, such as magnetic quantum cellular automata (MQCA, also called nanomagnet logic, NML) [3][4][5] , domain wall (DW) [6] , magnetic tunnel junction (MTJ) [7] , and spin transfer torque (STT) [8] , etc. The main reason for the interest in these nanomagnetic switches is their nonvolatility and comparably low power consumption in combination with the ability to perform logic and storage in one single element [9] .…”

Section: Introductionmentioning

confidence: 99%

“…Usually, the x-y direction defines the in-plane dimension, while the z axis direction depicts the out-of-plane dimension (thickness). The in-plane magnetizations along the y axis (easy axis) are used to encode binary logic states '1' (up) and '0' (down), respectively; while along the x axis (hard axis) denote 'null' logic [4] (see Fig. 1(b)).…”

Section: Introductionmentioning

confidence: 99%

“…To date, there are some candidate fabrication methods to realize nanomagnet-based logic devices [4,10] . However, although the advanced technologies are used in the NML manufacturing, defects are still likely to occur at such small size [11] , one representative fabrication imperfection is the major single missing edge or corner defect [12] .…”

Section: Introductionmentioning

confidence: 99%

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Reliability analysis of magnetic logic interconnect wire subjected to magnet edge imperfections

Zhang¹,

Yang²,

Li³

et al. 2018

J. Semicond.

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Nanomagnet logic (NML) devices have been proposed as one of the best candidates for the next generation of integrated circuits thanks to its substantial advantages of nonvolatility, radiation hardening and potentially low power. In this article, errors of nanomagnetic interconnect wire subjected to magnet edge imperfections have been evaluated for the purpose of reliable logic propagation. The missing corner defects of nanomagnet in the wire are modeled with a triangle, and the interconnect fabricated with various magnetic materials is thoroughly investigated by micromagnetic simulations under different corner defect amplitudes and device spacings. The results show that as the defect amplitude increases, the success rate of logic propagation in the interconnect decreases. More results show that from the interconnect wire fabricated with materials, iron demonstrates the best defect tolerance ability among three representative and frequently used NML materials, also logic transmission errors can be mitigated by adjusting spacing between nanomagnets. These findings can provide key technical guides for designing reliable interconnects.

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“…Indeed, (ℎ − 𝑙) also represents the missing edge amplitude of the trapezoid-shaped magnet. [15] An identical ℎ × 𝑤 parameter is used for the regular shape nanomagnet.…”

mentioning

confidence: 99%

Shape Anisotropy and Resonance Mode Guided Reliable Interconnect Design for In-plane Magnetic Logic

Yang¹,

Zhang²,

Zhang³

et al. 2018

Chinese Phys. Lett.

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Dipole coupled nanomagnets controlled by the static Zeeman field can form various magnetic logic interconnects. However, the corner wire interconnect is often unreliable and error-prone at room temperature. In this study, we address this problem by making it into a reliable type with trapezoid-shaped nanomagnets, the shape anisotropy of which helps to offer the robustness. The building method of the proposed corner wire interconnect is discussed, and both its static and dynamic magnetization properties are investigated. Static micromagnetic simulation demonstrates that it can work correctly and reliably. Dynamic response results are reached by imposing an ac microwave field on the proposed corner wire. It is found that strong ferromagnetic resonance absorption appears at a low frequency. With the help of a very small ac field with the peak resonance frequency, the required static Zeeman field to switch the corner wire is significantly decreased by ∼21 mT. This novel interconnect would pave the way for the realization of reliable and low power nanomagnetic logic circuits.

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Micromagnetic simulation of exploratory magnetic logic device with missing corner defect

Cited by 10 publications

References 16 publications

Design of NAND/NOR Logic Gate Clocked by Voltage-generated Stress

Design of NAND/NOR Logic Gate Clocked by Voltage-generated Stress

Reliability analysis of magnetic logic interconnect wire subjected to magnet edge imperfections

Shape Anisotropy and Resonance Mode Guided Reliable Interconnect Design for In-plane Magnetic Logic

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