2016
DOI: 10.1016/j.pcrysgrow.2016.04.016
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Microchannel epitaxy

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Cited by 5 publications
(3 citation statements)
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“…for example, utilizes in-situ periodic temperature cycles (figure 5(a)). The oscillating temperature range encompasses the III-V growth temperature, thus inducing different strain signs and magnitudes in the III-V thin films due to the different thermal expansion coefficients between III-V and [39,40], (c) conformal growth [41], and (d) corrugated epitaxial lateral overgrowth (CELOG) [42]. (e) Tilted SEM and (f) cross-sectional TEM of InP grown on Si using CELOG.…”
Section: Dislocation Engineering Of Iii-v Templates Grown On Simentioning
confidence: 99%
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“…for example, utilizes in-situ periodic temperature cycles (figure 5(a)). The oscillating temperature range encompasses the III-V growth temperature, thus inducing different strain signs and magnitudes in the III-V thin films due to the different thermal expansion coefficients between III-V and [39,40], (c) conformal growth [41], and (d) corrugated epitaxial lateral overgrowth (CELOG) [42]. (e) Tilted SEM and (f) cross-sectional TEM of InP grown on Si using CELOG.…”
Section: Dislocation Engineering Of Iii-v Templates Grown On Simentioning
confidence: 99%
“…This includes techniques such as epitaxial lateral overgrowth (ELOG), depicted in figure 6, and the bufferless III-V growth on Si which will be discussed in section 4. In ELOG, beginning with a III-V template grown on Si (figure 6(a)), a SiO 2 pattern is defined on the III-V surface for subsequent III-V regrowth [39,40]. This setup effectively blocks TDs located right underneath the SiO 2 growth mask.…”
Section: Dislocation Engineering Of Iii-v Templates Grown On Simentioning
confidence: 99%
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