2015
DOI: 10.1063/1.4922885
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Microcantilever based distance control between a probe and a surface

Abstract: We demonstrate a method to accurately control the distance between a custom probe and a sample on a µm to nm scale. The method relies on the closed-loop feedback on the angular deflection of an in-contact AFM microcantilever. High performance in stability and accuracy is achieved in this method by taking advantage of the small mechanical feedback path between surface and probe. We describe how internal error sources that find their origin in the microcantilever and feedback can be minimized to achieve an accur… Show more

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Cited by 4 publications
(7 citation statements)
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“…We obtain a displacement range from in-contact (d = 0 μm) up to d = 2 μm and an axial positioning accuracy of better than Δd = 3 nm. 40 We validate our experimental approach using the wellcharacterized synthetic fluorophore rhodamine 101, a dye without dark fraction that is often used as a standard reference dye in fluorescence quantum yield measurements. 46 Moreover, Figure 3 shows that it emits in a similar wavelength range as the fluorescent proteins studied here.…”
Section: ■ Resultsmentioning
confidence: 93%
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“…We obtain a displacement range from in-contact (d = 0 μm) up to d = 2 μm and an axial positioning accuracy of better than Δd = 3 nm. 40 We validate our experimental approach using the wellcharacterized synthetic fluorophore rhodamine 101, a dye without dark fraction that is often used as a standard reference dye in fluorescence quantum yield measurements. 46 Moreover, Figure 3 shows that it emits in a similar wavelength range as the fluorescent proteins studied here.…”
Section: ■ Resultsmentioning
confidence: 93%
“…The deflection from an in-contact AFM cantilever is used as a feedback signal to control the distance d between the mirror and the sample. We obtain a displacement range from in-contact ( d = 0 μm) up to d = 2 μm and an axial positioning accuracy of better than Δd = 3 nm …”
Section: Resultsmentioning
confidence: 96%
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“…Mechanical vibrations, uneven thermal expansion or any mechanical drift easily change the distances in the order of some hundred nanometers. We recently developed a method based on AFM technology to position a probe above a surface with nanometer accuracy [18]. We use the deflection from an in-contact AFM cantilever as feedback signal to achieve realtime control over the distance d between probe and sample [schematic see Fig.…”
Section: Technical Realizationmentioning
confidence: 99%