2010
DOI: 10.1103/physrevstab.13.080705
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Microbunch preserving bending system for a helical radiator at the European X-ray Free Electron Laser

Abstract: At the European X-ray Free Electron Laser there is a planar undulator system under construction called SASE3, which produces intense linearly polarized light in the wavelength range from 0.4-1.6 nm. Nevertheless there is a strong demand for circularly polarized radiation in this wavelength range. An important part of a potential solution is described in this paper. After the planar undulator the electron beam, which is completely bunched, is sent through a suitable radiator. This can be an economically and tec… Show more

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Cited by 10 publications
(10 citation statements)
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“…Such a prebunched beam can be used to generate coherent attosecond hard X-ray radiation for applications such as core electron ultrafast dynamics studies [20]. Careful lattice design is needed in order to preserve the prebunched microstructure of the electron beam before entering the undulator for X-ray radiation [21].…”
Section: Discussionmentioning
confidence: 99%
“…Such a prebunched beam can be used to generate coherent attosecond hard X-ray radiation for applications such as core electron ultrafast dynamics studies [20]. Careful lattice design is needed in order to preserve the prebunched microstructure of the electron beam before entering the undulator for X-ray radiation [21].…”
Section: Discussionmentioning
confidence: 99%
“…7 requires only magnetic optics that are already present in an undulator line. This contrasts with the elegant but lengthy achromatic systems envisioned to rotate and preserve microbunches through a bend [15,32,33].…”
Section: Soft X-ray Applicationsmentioning
confidence: 91%
“…The result, demonstrated by the wavelength scaling in Eq. (15), is a critical angle of ∼2 μRad at 1.5 Å.…”
Section: Improved Rotation and Hard X Raysmentioning
confidence: 99%
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“…We assume there is no horizontal-vertical coupling in where l and δ are the longitudinal offset and momentum deviation. Following the steps outlined Section 5.3, the sample lengthening due to second-order effects (ignoring terms proportional to l) is [30]:…”
Section: Second Order Path Lengthmentioning
confidence: 99%