Micro-Line Investigation in Titanium Dioxide Thin Film Coated on TiNi Alloy by Indirect Microscopy

Abstract

Titanium Dioxide thin film was synthesized on Titanium Nickelide alloy by using sol-gel spin coating method. Nowadays, it is a big issue to investigate the micro crack line in any thin film through the optical microscope for character the adhesion. The super-resolution microscope is better for evaluating the adhesion. The surface morphology of the film was studied using Scanning Electron Microscopy (SEM). Recently, only expensive and inconvenient non-optical method such as SEM (Scanning Electron Microscope) and TEM (Transmission Electron Microscope) are available for high resolution services. Here, we are reporting on the investigations of the crack line in titanium dioxide thin film coated on titanium nickelide alloy by Superresolution Parameter Indirect Microscopy Imaging. Furthermore, we found that the crack line can be seen in PIMI images whereas in SEM the crack line not seen clearly even the magnification of SEM is 10000X, which have been demonstrated by comparing the line intensity across the crack.