Micro Fluorescent X-Ray Analyzer

Shiraiwa, Toshio; Fujino, Nobukatsu

doi:10.1007/978-1-4684-8676-6_6

Cited by 3 publications

(1 citation statement)

References 6 publications

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“…However, it is possible to obtain these from the microprobe analysis of stoechiometric binary compounds. Some studies, concerning oxides and carbides in particular, have already been carried out (Fornwalt and Manzione 1966, Kohlhaas and Scheiding 1969a, 1969b, Shiraiwa and Fujino 1968. The precision and the validity of the results obtained depend upon the choice of the correction used.…”

Section: Measurements Of the Absorption Coejicientsmentioning

confidence: 99%

A quantitative analysis of very light elements by the electron probe microanalyser

Ruste¹,

Gantois²

1975

J. Phys. D: Appl. Phys.

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A modified ZAF method was chosen. For the atomic-number correction, the classical form is maintained by using the mean ionization energy of Zeller. For the absorption correction, the use of the complete expression of the function f( chi ), including the surface ionization phi (O), is required. A few examples of quantitative analysis are given, based on this method. A new semi-empirical table of absorption coefficients, with regard to these elements, is presented. The experimental difficulties which were encountered are examined. This method does not apply to all the elements, only to the low-atomic-number ones. In fact, for each element, a particular value for sigma and h must be chosen.

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Section: Measurements Of the Absorption Coejicientsmentioning

confidence: 99%

A quantitative analysis of very light elements by the electron probe microanalyser

Ruste¹,

Gantois²

1975

J. Phys. D: Appl. Phys.

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Considerations on a 3D‐XRF by pixel scanning and variable x‐ray geometry

Ebel

Svagera

et al. 1993

X-Ray Spectrometry

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The principle of a three-dimensional x-ray fluorescence analysis was verified by the example of lateral thickness distributions of Zn-layers on steel. The results of the experiments were compared with those of measurements performed on a cross-section with a scanning electron microscope. This comparison confirmed the XRF results and indicated the limitations of the method due to the present value of the lateral resolution of 1 mm, and the applicability of Zn Ka and Fe Ka radiation to layer thicknesses of ca. 20 pm.

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Large-Area X-Ray Micro-Fluorescence Imaging OF Heterogeneous Materials

Cross¹,

Lamb²,

et al. 1991

Adv. x-ray anal.

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An X-ray Micro-Fluorescence (XRMF) spectrometer, with an analysis area of about 100 by 150 microns, has been used to collect 2-dimensional X-ray intensity maps over large-area (5 to 50 mm in X and Y) samples. These intensity maps were collected by scanning the sample on an XY stage, and converting X-ray Energy-Dispersive spectra to peak intensities for the elements of interest. The maps, when displayed using false-color or pseudogray scales, show the distribution of individual chemical elements over the analysis area. These maps can be collected at speeds from about 1 minute per frame (analysing 25 elements simultaneously). Greater precision of chemical intensities, or larger area maps, may require several hours, particularly if extensive data processing is performed at each point. XRMF has advantages over more conventional SEM-EDS X-ray mapping, including sample preparation and presentation, as well as improved signal-to-noise ratios.A technique is described which assists in analyzing the large amount of data which is collected in each map. Principal Component Analysis (PCA) is performed on all of the elemental maps simultaneously. This technique compresses the many elemental intensity maps into a few principal components, resulting in many fewer maps to evaluate. The intensity maps of these principal components display the most pertinent information. They can also be plotted as scatter plots which can help with the partitioning of the data into individual phases. This procedure can potentially be automated as a method for phase analysis. The selected pixels from the scatter plots can be averaged and converted into phase compositions, and the phase information re-displayed on the original elemental or principal component maps.This technique has been applied to a thin section of rock, and to a synthetic multiphase alloy sample.

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Micro Fluorescent X-Ray Analyzer

Cited by 3 publications

References 6 publications

A quantitative analysis of very light elements by the electron probe microanalyser

A quantitative analysis of very light elements by the electron probe microanalyser

Considerations on a 3D‐XRF by pixel scanning and variable x‐ray geometry

Large-Area X-Ray Micro-Fluorescence Imaging OF Heterogeneous Materials

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