29th European Photovoltaic Solar Energy Conference and Exhibition; 390-396 2014
DOI: 10.4229/eupvsec20142014-2bo.1.3
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Micro-Cracks in Silicon Wafers and Solar Cells: Detection and Rating of Mechanical Strength and Electrical Quality

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“…Numerous studies have explored automatic photovoltaic inspection using various imaging methods. Demant et al [130] employed a support vector machine algorithm for the automatic classification of cracks in photoluminescence (PL) images. Stromer et al [131] proposed an enhanced EL image crack segmentation framework.…”
Section: Alves Et Al [129] 2021mentioning
confidence: 99%
“…Numerous studies have explored automatic photovoltaic inspection using various imaging methods. Demant et al [130] employed a support vector machine algorithm for the automatic classification of cracks in photoluminescence (PL) images. Stromer et al [131] proposed an enhanced EL image crack segmentation framework.…”
Section: Alves Et Al [129] 2021mentioning
confidence: 99%