Micro-annealing studies of Pt/Co multilayers for magneto-optic recording applications

Wright, C. David; Clegg, W.W.; Boudjemline, Attia; Heyes, N.A.E.; Grundy, P.J.; Pollard, Robert; Greaves, S.J.; Petford-Long, A. K.; Kim, Y.H.; Jakubovics, J. P.

doi:10.1109/20.179592

Cited by 9 publications

(6 citation statements)

References 9 publications

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“…Annealing studies on Co/Pt films have revealed several contradictory effects [17][18][19][20][21]. Amongst these, anisotropy and coercivity have been reported to both increase and decrease with increasing temperature, depending on film composition, thickness and the deposition conditions.…”

Section: Microstructure and Anisotropy Of Co/pt Multilayersmentioning

confidence: 99%

“…Amongst these, anisotropy and coercivity have been reported to both increase and decrease with increasing temperature, depending on film composition, thickness and the deposition conditions. These effects are usually related to temperature induced changes in the physical microstructure of the films [17][18][19][20][21].…”

Section: Microstructure and Anisotropy Of Co/pt Multilayersmentioning

confidence: 99%

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Magnetization reversal at elevated temperatures in Co/Pt multilayer thin films

Phillips

O'Grady

Lodder

2001

J. Phys. D: Appl. Phys.

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In this paper we report upon a study of the magnetization reversal mechanisms in Co/Pt thin films at elevated temperatures. An alternating gradient force magnetometer has been modified in order to perform measurements at elevated temperatures. The data obtained from hysteresis loops and remanence curves measured at high temperature has been used to analyse reversal mechanisms which are discussed in terms of a well established two-coercivity model. The high sensitivity of the magnetic measurements reveal subtle temperature dependent changes in the magnetic characteristics of the films, which are attributed to thermally induced modifications of the energy barriers to magnetization reversal and film microstructure. The evolution of domain structure during reversal has been examined by magnetic force microscopy for a sample placed in varying remanent states at elevated temperatures and is found to correlate with the two-coercivity model. Additionally, a method by which samples may be demagnetized in situ at elevated temperatures is discussed along with domain wall motion induced by the stray field from magnetic force microscope tips.

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Section: Microstructure and Anisotropy Of Co/pt Multilayersmentioning

confidence: 99%

Section: Microstructure and Anisotropy Of Co/pt Multilayersmentioning

confidence: 99%

Magnetization reversal at elevated temperatures in Co/Pt multilayer thin films

Phillips

O'Grady

Lodder

2001

J. Phys. D: Appl. Phys.

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“…The write laser power was in excess of l3m W. The high laser power required for recording on this film is probably due to the increased Curie temperatures of PtlCo multilayers where the Pt thickness is around lOA [6]. The Pt underlayer has also been shown to result in a recording film with a more particulate microstructure and a higher coercivity and would also act as a heat sink during recording [7,8]. The increase in carrier power shown in Fig.…”

Section: Recording Testsmentioning

confidence: 94%

The DESIGN OF a COMBINED OPTICAL DISC TESTER AND R-Θ SCANNING LASER MICROSCOPE

et al. 1995

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Abstract-This paper describes the design of a novel, combined R-9 scanning laser microscope and optical disk tester, which is to be used for the testing and evaluation of optical recording media. The instrument is capable of perfonning a range of standard read/write tests, whilst simultaneously yielding a microscopic image of the recorded bit structure with sub-micron resolution. A range of optical media can be investigated including magneto-optic, phase-change and write-once fonnats such as dye-polymer media.

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“…The phenomenon of increasing coercivity has been reported in a few experiments on the confidence of a magnetooptical medium using very thin Co/Pt film [21,22]. But the mechanism of this phenomenon was not clarified.…”

Section: Effect Of Annealing Multilayered Co/pd Filmmentioning

confidence: 99%

“…6, respectively increased from 0.48 kOe and 0.8 kilogauss (63.66 emu/cm 3 ) to 2.8 kOe and 2.9 kilogauss (230.8 emu/cm 3 ) with 30 min of atmospheric annealing at 300 °C. The phenomenon of increasing coercivity has been reported in a few experiments on the confidence of a magnetooptical medium using very thin Co/Pt film [21,22]. But the mechanism of this phenomenon was not clarified.…”

Section: Effect Of Annealing Multilayered Co/pd Filmmentioning

confidence: 99%

Multilayered Co/Pd film for thermomagnetic printers using the perpendicular recording method

Yamane

Kobayashi

1999

Electron. Comm. Jpn. Pt. II

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A recording medium for thermomagnetic printers using a perpendicular recording method was developed using multilayered Co/Pd film. The magnetic properties necessary for a perpendicular recording medium were estimated from model calculations, and the cases of perpendicular and in‐plane recording were compared. In perpendicular recording, the profile of the attractive force on a toner particle depends on the particle height; more toner particles are attracted to the center of a recorded dot. The perpendicular magnetic properties of the multilayered Co/Pd film were improved by atmospheric annealing. Annealed film exhibited magnetic properties suitable for a recording medium. Using this medium, distinct images were developed for the first time with magnetic toner in perpendicular thermomagnetic printing. © 1999 Scripta Technica, Electron Comm Jpn Pt 2, 82(10): 18–26, 1999.

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Micro-annealing studies of Pt/Co multilayers for magneto-optic recording applications

Cited by 9 publications

References 9 publications

Magnetization reversal at elevated temperatures in Co/Pt multilayer thin films

Magnetization reversal at elevated temperatures in Co/Pt multilayer thin films

The DESIGN OF a COMBINED OPTICAL DISC TESTER AND R-Θ SCANNING LASER MICROSCOPE

Multilayered Co/Pd film for thermomagnetic printers using the perpendicular recording method

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