MgF_2 Fabry-Perot etalon plates for the vacuum ultraviolet

Bideau-Méhu, A.; Guern, Y.; Abjean, R.; Johannin-Gilles, A.

doi:10.1364/ao.15.002626

Cited by 12 publications

(18 citation statements)

References 2 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…͑7͒ adopted from Ref. 24, one uses the empirical dispersion equation from Ref. 31 with a similar replacement of the two atomic lines by the exciton frequencies and density "scaling" to the liquid.…”

Section: Discussionmentioning

confidence: 99%

“…However, it should be noted that the oscillator strengths and the multiplicative constant used in Eq. ͑8͒ were originally 24 obtained by fitting the Sellmeier formula ͓our Eq. ͑6͔͒ to the data taken at between 140 and 254 nm, thus its use outside this wavelength range is not entirely reliable.…”

Section: Discussionmentioning

confidence: 99%

“…This equation was fitted to experimental values of the refractive index of Xe gas at STP ͑0°C, 760 torr͒ between 140 and 254 nm by Bideau-Mehu et al 24 They replaced the complete summation by three terms: two corresponding to the main atomic resonance lines 1 = 146.9 nm and 2 = 129.5 nm ͑the latter ascribed to the lines at 129.5 and …”

Section: Calculation Of the Refractive Indexmentioning

confidence: 99%

“…͑5͒ with the summation limited to three terms, as in Ref. 24, and using numerical values for the oscillator strengths and the multiplicative factor on the right side of Eq. ͑7͒.…”

Section: ͒mentioning

confidence: 99%

“…However, in view of the absence of data on the oscillator strengths associated with the excitons, they were approximated to those reported for the gas phase. 24 Hence, the sum of the oscillator strengths responsible for n is the same as that for the gas and is 5.5959, which means that only the outer electrons contribute significantly to the refractive index ͑Z Xe =54͒. It is worth emphasizing that any collective excitations occurring in the condensed phase were not taken into account, but their effect on the refractive index in condensed rare gases is expected to be small.…”

Section: ͑8͒mentioning

confidence: 99%

See 4 more Smart Citations

New approach to the calculation of the refractive index of liquid and solid xenon

Hitachi¹,

Chepel²,

Lopes³

et al. 2005

The Journal of Chemical Physics

View full text Add to dashboard Cite

show abstract

Section: Discussionmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

Section: Calculation Of the Refractive Indexmentioning

confidence: 99%

“…͑5͒ with the summation limited to three terms, as in Ref. 24, and using numerical values for the oscillator strengths and the multiplicative factor on the right side of Eq. ͑7͒.…”

Section: ͒mentioning

confidence: 99%

Section: ͑8͒mentioning

confidence: 99%

See 3 more Smart Citations

New approach to the calculation of the refractive index of liquid and solid xenon

Hitachi¹,

Chepel²,

Lopes³

et al. 2005

The Journal of Chemical Physics

View full text Add to dashboard Cite

show abstract

VUV Optical Constants of Liquid and Solid Xenon at the Triple Point

Subtil¹,

Laporte²,

Reininger

et al. 1987

Physica Status Solidi (b)

View full text Add to dashboard Cite

Accurate optical constants for solid and liquid Xe are reported. The samples are prepared under ideal conditions in a closed cell. Reflectivity spectra between 7 5 hv 5 11 eV are recorded for normal and grazing incidence of the radiation and a t temperatures T = 161.2 and 163.2 K. By a special evaluation technique optical constants are deduced. They are compared to previous data for solid Xe and the differences are found to be very large. The reasons for these discrepancies and the consequences are discussed.Es werden genaue optische Konstanten fur Xe in fliissigem und festem Zustand vorgestellt. Die Proben werden unter idealen Bedingungen in einer geschlossenen Zelle prgpariert. Reflexionsspektren werden fur senkrechten und streifenden Einfall der Strahlung aufgenommen. Mit einem speziellen Auswerteverfahren konnen die optischen Konstanten bestimmt werden. Die Ergebnisse weichen erheblich von allen bisher veroffentlichten Daten fur festes Xe ab. Die Ursachen hierfur und die Konsequenzen werden diskutiert.

show abstract

Length Determination of a Fixed-Path Cylindrical Resonator with the Dual Wavelength Laser Interference Method

Sun¹,

Zhang²,

Zhang

et al. 2011

Int J Thermophys

View full text Add to dashboard Cite

The length is one of the key parameters for a cylindrical acoustic resonator used for measurement of the Boltzmann constant. A research project has been conducted in the National Institute of Metrology (NIM), China, for the re-determination of the Boltzmann constant with a fixed-path cylindrical acoustic resonator. This paper describes the procedure for the length determination. The excess fraction method was applied to accurately obtain the length of the resonator. This method is performed in a two-step procedure. First, the length is coarsely determined as L 1 with an uncertainty of 1.5 µm in the length division of NIM. Second, the result of the coarse measurement is further interpolated by the dual wavelength laser interferometer with a resolution of 1 nm, which is composed of a 633 nm He-Ne laser and a 657 nm semiconductor laser. A Michelson wavemeter has been constructed for calibration of the wavelength of the semiconductor laser. The length variation of the resonator has to be measured from room temperature to the triple point of water (TPW). As a result, the laser interferometer can be also used as a precise dilatometer. The result and the measurement uncertainty of the length measurement are given in this paper.

show abstract

MgF_2 Fabry-Perot etalon plates for the vacuum ultraviolet

Cited by 12 publications

References 2 publications

New approach to the calculation of the refractive index of liquid and solid xenon

New approach to the calculation of the refractive index of liquid and solid xenon

VUV Optical Constants of Liquid and Solid Xenon at the Triple Point

Length Determination of a Fixed-Path Cylindrical Resonator with the Dual Wavelength Laser Interference Method

Contact Info

Product

Resources

About