Metrology of Single Photons for Quantum Information Technologies

Magnitskii, S. A.; Frolovtsev, D. N.; Agapov, D. P.; Demin, A. V.; Крутиков, В. Н.; Левин, Г. Г.

doi:10.1007/s11018-017-1179-2

Cited by 8 publications

(4 citation statements)

References 16 publications

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“…A number of different quantum technologies use single photon sources as an essential component, including secure communications using quantum key distribution 1,2 , metrology 3 , and scalable optical quantum computing 4,5 . Solid state devices make it possible to structure the local photonic environment in a way that promotes emission into a mode that will couple well to the optics in the far field 6,7 and suppressing emission in unwanted directions 8,9 , allowing the emitted photons to be efficiently collected.…”

Section: Introductionmentioning

confidence: 99%

Quantum dot micropillar cavities with SiO2 hard mask microlenses

Jordan,

Androvitsaneas,

Clark

et al. 2024

Photonic and Phononic Properties of Engineered Nanostructures XIV

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We report finite difference time domain simulations of GaAs-Al0.95Ga0.05As micropillars containing single quantum dots capped with SiO2 microlenses of differing shapes and heights, finding oscillations of relevant properties as functions of lens thickness, with the Q factor and Purcell factor varying by a factor of ~2, while the mode field diameter and numerical aperture change over a 10% range. Such structures could be realised by modifying our previously reported direct-write lithography process to retain some of the hard mask on top of the pillar, shaping the emission of these single photon sources to be more efficiently collected into a single mode fibre.

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Section: Introductionmentioning

confidence: 99%

Quantum dot micropillar cavities with SiO2 hard mask microlenses

Jordan,

Androvitsaneas,

Clark

et al. 2024

Photonic and Phononic Properties of Engineered Nanostructures XIV

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“…Consequently, there has been a tremendous improvement in single‐photon devices and related readout schemes. [ 13–15 ] The most commonly used SPS is the heralded photon source, which is the best SPS in terms of g (2) (τ) values (a parameter used to evaluate the multi‐photon emission probability), obtained either by post‐selection [ 16 ] or without post‐selection. [ 17 ] SPS suffers from issues such as optical filtering, distinguishability, scalability, and extraction efficiency.…”

Section: Introductionmentioning

confidence: 99%

Metrology Perspective of Single‐Photon Detectors: Review on Global Calibration Methods

et al. 2021

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The evolution of quantum standards for SI units and funding support from national governments has led to rapid technological developments in the quantum sciences. With this, new and more powerful quantum optical devices that find applications in several fields are obtained. Single‐photon detectors (SPDs) are considered as a critical element in these emerging technologies. A traceability chain for SPD calibration is required to ensure their performance reliability and quality. Different methods and techniques are being developed worldwide for the calibration of SPDs. In this paper, the developments that have occurred globally in SPD calibration and the uncertainty value achieved until now are summarized along with the scope of possible improvement areas.

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“…In [1] and in subsequent documents, the first procedures for characterizing pseudo-single-photon-sources are provided. But the proposed characterization methods are limited to measuring the Granger's α-parameter and characterizing the quantum states of the generated light themselves remains open, although this is a key challenge for quantum optics [2].Over the past 3 years, our laboratory has been developing methods for characterizing quantum optics devices. The work is carried out in 3 directions: 1) the development and characterization of quasi-single-photon SPR sources using quantum tomography, 2) the characterization of few-photon sources by the photon counting method, and 3) the development and characterization of photon counters using standardless methods.…”

mentioning

confidence: 99%

mentioning

confidence: 99%

Metrology of low-photon light sources

Magnitskiy

2019

EPJ Web Conf.

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In the report the parameterization of few-photon light sources is discussed. This question relates to a new area of research in quantum optics -the development of methods for characterizing optical components and devices used in optical quantum technologies that are supposed to be used in industry. Apart from, the recent results in this field obtained in the Laboratory of Experimental Quantum Optics and Nanophotonics of M.V.Lomonosov Moscow State University are briefly presented At present, optical quantum technologies are emerging from the walls of laboratories and, as a result, issues of parameterization of quantum optics devices are become relevant. In 2016, the European Telecommunications Standards Institute (ETSI) issued the first preliminary standard [1] which established the rules for characterizing the optical components of quantum key distribution systems. Activity in this direction over the past 3 years has increased significantly. New specialized organizations and expert groups have emerged whose purpose is to develop preliminary standards for optical components and quantum optics devices. Obviously, the existing methods for characterizing classical light sources are insufficient to characterize quantum light sources. In [1] and in subsequent documents, the first procedures for characterizing pseudo-single-photon-sources are provided. But the proposed characterization methods are limited to measuring the Granger's α-parameter and characterizing the quantum states of the generated light themselves remains open, although this is a key challenge for quantum optics [2].Over the past 3 years, our laboratory has been developing methods for characterizing quantum optics devices. The work is carried out in 3 directions: 1) the development and characterization of quasi-single-photon SPR sources using quantum tomography, 2) the characterization of few-photon sources by the photon counting method, and 3) the development and characterization of photon counters using standardless methods. The schemes of a double-crystal SPR generators were developed which are not subject to the negative influence of the Migdall effect on the degree of entanglement of the states of generated photon pairs [3]. The method and the prototype of the device for certification of such sources has been proposed [4]. The effectiveness of certification was analyzed using various criteria of entanglement. The choice fell on the application of the parameter of proximity of quantum states -fidelity ( ). It was shown that when using such sources, F adequately characterizes the error of the distribution of the quantum cryptographic key,

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Metrology of Single Photons for Quantum Information Technologies

Cited by 8 publications

References 16 publications

Quantum dot micropillar cavities with SiO2 hard mask microlenses

Quantum dot micropillar cavities with SiO2 hard mask microlenses

Metrology Perspective of Single‐Photon Detectors: Review on Global Calibration Methods

Metrology of low-photon light sources

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