Methyl and carbon–carbon double bond in anhydride molecules modulated surface charge trap depth of epoxy materials

Abstract

Epoxy insulators in gas insulated switchgear (GIS) and gas insulated transmission lines (GIL) tend to accumulate surface charges, leading to insulation flashover. Improving the surface trap characteristics of epoxy materials, which can accelerate the surface charge dissipation of epoxy insulators, is a promising method to improve the surface insulation performance. The surface trap characteristics of epoxy materials are strongly influenced by the chemical groups in the acid anhydride molecules. In this work, by quantum chemical calculations and isothermal surface potential decay (ISPD) tests, taking six organic anhydrides that differ only in the methyl and carbon-carbon double bonds, we find the modulation laws of methyl and carbon-carbon double bonds on the charge trap depth within and between molecular chains. The regulation mechanism is revealed from the microscopic perspectives of electron energy structure and electron cloud offset. The changes of surface charge trap depth of epoxy materials are primarily attributed to the changes in the spatial distribution of the electron cloud density between and on the valence bonds caused by the interaction between the electron-donating methyl group and the electron-absorbing carbon-carbon double bond.