Method to diagnose open‐circuit faults in active power switches and clamp‐diodes of three‐level neutral‐point clamped inverters

Abadi, Mohsen Bandar; Mendes, André M. S.; Cruz, Sérgio M. A.

doi:10.1049/iet-epa.2015.0644

Cited by 52 publications

(15 citation statements)

References 28 publications

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“…The use of multilevel converters is now considered as a very interesting solution for several applications [36], [37]. A study in which is presented a multilevel inverter fed SRM for torque ripple minimization is proposed in [38].…”

Section: Introductionmentioning

confidence: 99%

A Multilevel Fault-Tolerant Power Converter for a Switched Reluctance Machine Drive

et al. 2020

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Reliability in the electrical drives is becoming an important issue in many applications. In this context, the reliability associated to the switched reluctance machine (SRM) is also an important area of research. One of the major problems, that strongly affect its operation, are drive power semiconductors faults. Typical power converter topologies used in SRM drives cannot handle faults in their power semiconductors. So, this paper presents a power converter topology that provides fault-tolerant capabilities to the drive under a switch fault. This power converter will be used considering that a change in the direction of the current that flows in the SRM windings does not affect the behavior of the machine. Besides that, the proposed power converter will allow to generate multilevel phase voltages in order to apply different voltage levels as function of the SRM speed. A laboratory power converter was developed to test the SRM drive in normal and faulty conditions. From the obtained results it was possible to verify the fault-tolerant capability of the drive under switch faults in different devices and failure modes. It was also possible to confirm the multilevel operation of the drive.

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Section: Introductionmentioning

confidence: 99%

A Multilevel Fault-Tolerant Power Converter for a Switched Reluctance Machine Drive

et al. 2020

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“…Different diagnostic algorithms for IGBTs have recently been developed. A study of transistor malfunction diagnostic methods is provided in [7–10]. Open‐switch faults are detected by the resultant change in the output voltage or current produced by the inverter [11–14].…”

Section: Introductionmentioning

confidence: 99%

Detection of negative sequence components in diagnosing and tolerating open‐gate fault for a voltage‐source inverter in an induction motor drive

Al-Gahtani

Azazi

Nelms

et al. 2020

IET power electron.

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Power converter faults represent about 12% of electrical system faults. More than 31% of these converter faults are caused by the transistors in the converters. These transistor failures are classified into open‐gate and short‐gate faults. A fault diagnostic and tolerant control system is proposed in this study for an open‐gate fault of a three‐phase voltage‐source inverter (VSI). The system under study is an induction motor fed by a VSI. The diagnostic technique uses a detection method of positive and negative sequence components, which requires only the measurement of motor currents. The diagnostic signals are derived from the negative sequence components of the motor currents. These signals are then compared using logic functions to trigger the tolerant control. In the case of an open‐gate fault, the tolerant system converts the inverter topology from six switches to four switches where the faulty inverter leg is disconnected. The proposed control method was evaluated under steady‐state and transient conditions through simulation and experiments. The results confirm an effective and reliable performance of the motor under an open‐gate fault.

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“…Some efforts have been made in the fault diagnosis problem for the neutral-point-clamped topology [14][15][16][17][18] and T-type topology [19][20][21][22][23]. For the T-type inverter [19,20], location of the faulty switch is identified by the average value of phase current and change of the DC-link midpoint voltage.…”

Section: Introductionmentioning

confidence: 99%

Open‐circuit fault diagnosis method for the T‐type inverter based on analysis of the switched bridge voltage

Chen

Liu

Zhang

2019

IET Power Electronics

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Multilevel inverter topologies have been widely used in applications of wide-power range. Therefore, fault diagnosis of such circuits is becoming more and more important. The T-type topology, which is one of many multilevel topologies, has an advantage in terms of efficiency compared to the neutral-point-clamped type. This study proposes a new diagnosis method of an open-circuit (OC) fault for a three-level T-type inverter (3LT 2 I). The proposed method is achieved by measuring the bridge voltage and its duration time. The bridge voltage includes information of switching states of 3LT 2 I but not affected by the load. First, according to polarity of the reference voltage and corresponding phase current, working period of the 3LT 2 I is divided into four working regions. Then, the bridge voltage is analysed in detail when an OC fault occurs in different working regions. At last, a fault diagnosis circuit is designed to achieve automatic diagnosis for the OC fault. Simulation and experimental results show that the proposed method can identify the faulty switch exactly and quickly.

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Method to diagnose open‐circuit faults in active power switches and clamp‐diodes of three‐level neutral‐point clamped inverters

Cited by 52 publications

References 28 publications

A Multilevel Fault-Tolerant Power Converter for a Switched Reluctance Machine Drive

A Multilevel Fault-Tolerant Power Converter for a Switched Reluctance Machine Drive

Detection of negative sequence components in diagnosing and tolerating open‐gate fault for a voltage‐source inverter in an induction motor drive

Open‐circuit fault diagnosis method for the T‐type inverter based on analysis of the switched bridge voltage

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