2018
DOI: 10.3139/147.110515
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Method for the Detection of Grain Boundaries in α Ti-Based Alloys by means of Polarized Light Microscopy and Image Processing in MATLAB

Abstract: Metallographic methods which are typically comprising chemical etching processes are applied to reveal grain boundaries in sections of metallic materials. In the case of an optically anisotropic material, grain boundaries can also be detected suing polarized light microscopy (PLM). To this end, the identification of grain boundaries, an automated image processing procedure, based on PLM, was developed. In this context, two different α Ti-based alloys were examined: a cast, non-porous rod material and a materia… Show more

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Cited by 7 publications
(3 citation statements)
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“…In the study of Liu et al, [8] SEM images of AlSi10Mg processed by laser powder bed fusion (PBF-LB/M) were converted into binary images to analyze morphology features of the eutectic, cellular Al-Si microstructure. Morales-Rivas et al [9] used an automated image processing procedure based on the Canny method to detect grain boundaries on polarized LOM images of an α-Ti-based alloy. Another approach [4,10] used a combination of LOM and SEM images to segment and analyze the second phase of dual-phase steels.…”
Section: Doi: 101002/adem202300876mentioning
confidence: 99%
“…In the study of Liu et al, [8] SEM images of AlSi10Mg processed by laser powder bed fusion (PBF-LB/M) were converted into binary images to analyze morphology features of the eutectic, cellular Al-Si microstructure. Morales-Rivas et al [9] used an automated image processing procedure based on the Canny method to detect grain boundaries on polarized LOM images of an α-Ti-based alloy. Another approach [4,10] used a combination of LOM and SEM images to segment and analyze the second phase of dual-phase steels.…”
Section: Doi: 101002/adem202300876mentioning
confidence: 99%
“…After an appropriate virtual rotation of the PLM pictures back to the original position, grain boundaries are detected in each one based on gray contrast. The grain boundaries are used for an automated superimposition of the pictures and the subsequent grain recognition [11]. Subsequently, the gray evolution for each grain is fitted to a sine function, from which the phase shift and the amplitude values are obtained, as explained.…”
Section: Description Of C-axis Orientation Mapping Based On Polarizedmentioning
confidence: 99%
“…1). An ultrafine-grained material state was produced by equal channel angular pressing technique applied to a cp-Ti Grade 4 rectangular bar, so that the average grain size measured according to [9] is less than 2.5 µm. The second material state from a hot-rolled cp-Ti Grade 2 sheet with 0.6 mm thickness shows an average grain size of 35 µm and the largest grains can be observed in the micrograph of a cp-Ti Grade 2 round bar with an average grain size of 100 µm.…”
Section: Materials and Specimensmentioning
confidence: 99%