Method for Ensuring Accurate AC Waveforms With Programmable Josephson Voltage Standards

Burroughs, Charles J.; Rüfenacht, Alain; Benz, Samuel P.; Dresselhaus, Paul D.

doi:10.1109/tim.2013.2250192

Cited by 13 publications

(6 citation statements)

References 20 publications

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“…If the rms value of the transients matches exactly the rms value of the PJVS waveform, then the rms output is independent of the waveform frequency selected. This special operating bias point (the intersection of curves at different waveform frequencies) was first determined experimentally in TTSs and TVCs [83,85,103] and later described in detail by Burroughs et al [104]. However, the independent tuning method (without relying on a TVC standard) is rather fastidious, and the accuracy of the method remains affected by any external perturbations including current noise, stability of the bias electronics and changes in microwave power due to changes in the liquid helium level in the dewar [104].…”

Section: Pjvs Limitationsmentioning

confidence: 94%

“…This special operating bias point (the intersection of curves at different waveform frequencies) was first determined experimentally in TTSs and TVCs [83,85,103] and later described in detail by Burroughs et al [104]. However, the independent tuning method (without relying on a TVC standard) is rather fastidious, and the accuracy of the method remains affected by any external perturbations including current noise, stability of the bias electronics and changes in microwave power due to changes in the liquid helium level in the dewar [104]. Due to transient-related errors and the resulting lack of quantum accuracy in rms amplitude for stepwise-synthesized waveforms, most rms measurements with PJVS systems have been abandoned.…”

Section: Pjvs Limitationsmentioning

confidence: 94%

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Impact of the latest generation of Josephson voltage standards in ac and dc electric metrology

2018

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For decades, the quantum behavior of Josephson junctions has been employed as intrinsic standards for voltage metrology. Conventional dc Josephson voltage standards have been the primary standards for voltage, programmable Josephson voltage standards have been implemented in calibration services and precision measurements, such as the Planck constant, and Josephson arbitrary waveform synthesizers have been employed in ac voltage calibrations and precision measurements of the Boltzmann constant. With the anticipated redefinition of the Système International d'Unités, all types of Josephson voltage standards will become intrinsic standards and equivalent realizations of the unit volt. Here we review the stateof-the art performance, best practices, and current impact of these systems for various applications, with an emphasis on ac voltage metrology. We explain the limitations of each system, especially regarding the many potential systematic errors that affect their accuracy and performance for specific applications.

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Section: Pjvs Limitationsmentioning

confidence: 94%

Section: Pjvs Limitationsmentioning

confidence: 94%

Impact of the latest generation of Josephson voltage standards in ac and dc electric metrology

2018

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“…In addition the rise time of the transitions are usually below 10 ns, such a fast rise time typically is above the bandwidth limit of the ADC affecting the samples taken during this time. To overcome this limitation solutions as 'differential measurements' [11][12][13][14] or a Josephson-locked sythesizer (JoLoS) [15] can be used for ADC characterization.…”

Section: Based On Pjvsmentioning

confidence: 99%

Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer

Aguilar

Salinas

Kieler

et al. 2019

Meas. Sci. Technol.

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The capability to generate up to 1 V pure AC signals based on quantum standards marked a milestone on electrical metrology opening new applications that were not possible without this standard. Frequency response characterization of analog-to-digital converters (ADC) is fundamental for precision digital metrology. Several methods have been investigated for this characterization based on thermal converters, programmable Josephson voltage standard or input impedance measurements. This paper describes the method, the results obtained and the uncertainty estimation for the characterization of the amplitude frequency response at different aperture times of the DCV sampling function of the Keysight 3458-A using, for the first time, a Josephson arbitrary waveform synthesizer. This new standard allows one to extend the characterization to a higher frequency range and lower aperture times. The results show that the frequency response does not depend on aperture time and the same frequency correction can be applied in an extended frequency range. The knowledge of this correction will facilitate the application of the ADCs to higher frequencies, where low aperture times are required with accuracy in the order of V/V.

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“…Los trabajos realizados en esta tesis han sido soportados por el Centro Español de Metrología (CEM) y parcialmente financiados por los programas de investigación de la Unión Europea, Q-wave [13], ACQ-PRO, [18] Trace-PQM [19], sus resultados están siendo aplicados en el proyecto DIG-AC [20].…”

Section: Caracterización De Convertidores Digitales Mediante Patrones Cuánticosunclassified

“…[49], [50]. El objetivo fundamental del proyecto TRACE-PQM es facilitar esta transición [19] El CEM también optó por esta tecnología [51], que ha ido mejorando, disminuyendo las incertidumbres en un orden de magnitud. El elemento crítico de dicho sistema es la caracterización de los convertidores digitales.…”

Section: Método De Medida De Potencia Digitalunclassified

Caracterización de convertidores digitales mediante patrones cuánticos

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Method for Ensuring Accurate AC Waveforms With Programmable Josephson Voltage Standards

Cited by 13 publications

References 20 publications

Impact of the latest generation of Josephson voltage standards in ac and dc electric metrology

Impact of the latest generation of Josephson voltage standards in ac and dc electric metrology

Characterization of an analog-to-digital converter frequency response by a Josephson arbitrary waveform synthesizer

Caracterización de convertidores digitales mediante patrones cuánticos

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