Method for endurance optimization of the HIMOS/sup TM/ flash memory cell

Yao, T.; Lowe, A.; Vermeulen, T.; Bellafiore, N.; Houdt, J. Van; Wellekens, D.

doi:10.1109/relphy.2005.1493193

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Method for endurance optimization of the HIMOS/sup TM/ flash memory cell

Cited by 3 publications

References 5 publications

Investigation of charge trapping/de-trapping induced operation lifetime degradation in triple SuperFlash® memory cell

Investigation of charge trapping/de-trapping induced operation lifetime degradation in triple SuperFlash® memory cell

Optimization of programming conditions and endurance enhancement of SuperFlash® memory

Program Disturb Induced by Interface-Trap-Assisted Field and Thermal Electron Emission in the Channel of Split-Gate Memory Cell

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