We report the molecular beam epitaxy (MBE) growth and properties of (MgSe)n(ZnxCd1–x Se)m short-period superlattices(SPSLs) for potential application in II–VI devices grown on InP substrates. SPSL structures up to 1 μm thick with effective bandgaps ranging from 2.6 eV to above 3.42 eV are grown and characterized, extending the typical range possible for the ZnxCdyMg1–x–ySe random alloy beyond 3.2 eV. Additionally, ZnxCd1–xSe single and multiple quantum well structures using the SPSL barriers are also grown and investigated. The structures are characterized utilizing reflection high-energy electron diffraction, X-ray reflectance, X-ray diffraction and photoluminescence. We observed layer-by-layer growth and smoother interfaces in the QWs grown with SPSL when compared to the ZnxCdyMg1–x–ySe random alloy. The results indicate that this materials platform is a good candidate to replace the random alloy in wide bandgap device applications.