2011
DOI: 10.1103/physrevb.84.161410
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Metastable tetragonal structure of Fe100xGaxepitaxial thin films on ZnSe/GaAs(001) substrate

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Cited by 30 publications
(37 citation statements)
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“…Details are given in Ref. [21]. To quantify the mosaicity of the sample, we measure the FWHM of the (002) planes.…”
Section: Growth and Characterization Of Iron Thin Films: Details mentioning
confidence: 99%
“…Details are given in Ref. [21]. To quantify the mosaicity of the sample, we measure the FWHM of the (002) planes.…”
Section: Growth and Characterization Of Iron Thin Films: Details mentioning
confidence: 99%
“…In Ref. [19] we show that a tetragonal structure can be stabilized by specific growth procedures. This distortion is attributed to Ga preferential ordering along the growth direction, i.e., the [001] direction.…”
Section: Introductionmentioning
confidence: 98%
“…The curve shows the same square hysteresis with the same coercive field of about 95 Oe. In total electron yield the probing depth is expected to be of few nm and therefore to collect signal only from the top Fe 1 À x Ga x layer of 20 nm thickness [14,15]. Thus the top Fe 1 À x Ga x layer shows a ferromagnetic behavior with a single coercive field of 95 Oe.…”
Section: Resultsmentioning
confidence: 99%
“…The substrate temperature is gradually increased until 180°C, the surface MgO/Fe epilayer showed a weak 1 Â 1 streaklike RHEED diffraction pattern. On this MgO/Fe epilayer surface 20 nm-thickness of Fe 0.8 Ga 0.2 thin films were deposited by molecular beam epitaxy with growth rate of 0.2 nm per minute and with an appropriate stoecchiometry proportion of the beam equivalent pressures of Fe and Ga [14]. At the early stage of the growth, the surface of Fe 1 À x Ga x film showed 3D-spot-like features and once the coverage increases the spots were accompanied with steaks patterns, indicating the improvement of the crystalline film quality.…”
Section: Methodsmentioning
confidence: 99%