2015
DOI: 10.1016/j.jlumin.2014.12.003
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Metamorphosis of strain/stress on optical band gap energy of ZAO thin films via manipulation of thermal annealing process

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Cited by 41 publications
(18 citation statements)
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“…3(a) and 3(b), as previously reported. 10) The AZO seeded layer possesses a crystallite size of approximately 23 nm with a thickness of 135 nm. Figures 3(c)-3(h) illustrate the top and cross-sectional view of the FESEM images of ZnO nanorod array thin films deposited at various growth times.…”
Section: Resultsmentioning
confidence: 99%
“…3(a) and 3(b), as previously reported. 10) The AZO seeded layer possesses a crystallite size of approximately 23 nm with a thickness of 135 nm. Figures 3(c)-3(h) illustrate the top and cross-sectional view of the FESEM images of ZnO nanorod array thin films deposited at various growth times.…”
Section: Resultsmentioning
confidence: 99%
“…Furthermore, there is a reduction for structural defects of the film at high annealing temperature (shown in Figure 3d). The Urbach energy (Eu) is an empirical parameter representing structural defects and can be extracted from the absorption coefficient [15,16]. The Eu is extracted using Equation (4): α=α0exp(hvEu), where α0 is the pre-exponential factor.…”
Section: Resultsmentioning
confidence: 99%
“…Besides, we observed an enhancement of peak intensity especially for (002) plane which indicates that doping with Pb manage to improve the crystallinity of the ZnO film. The average crystallite sizes were acquired from the given equation [14]:…”
Section: Structural Propertiesmentioning
confidence: 99%