Metamorphic Testing for the Deepfake Detection Model

Pang, ChenXin; Pan, Ya; Bai, Hanli

doi:10.1109/qrs-c60940.2023.00012

2023 IEEE 23rd International Conference on Software Quality, Reliability, and Security Companion (QRS-C) 2023

DOI: 10.1109/qrs-c60940.2023.00012

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Metamorphic Testing for the Deepfake Detection Model

ChenXin Pang,

Ya Pan,

Hanli Bai

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Metamorphic Testing for the Deepfake Detection Model

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References 14 publications

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