2019
DOI: 10.1038/s41598-019-52119-3
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Metallic edge states in zig-zag vertically-oriented MoS2 nanowalls

Abstract: The remarkable properties of layered materials such as MoS2 strongly depend on their dimensionality. Beyond manipulating their dimensions, it has been predicted that the electronic properties of MoS2 can also be tailored by carefully selecting the type of edge sites exposed. However, achieving full control over the type of exposed edge sites while simultaneously modifying the dimensionality of the nanostructures is highly challenging. Here we adopt a top-down approach based on focus ion beam in order to select… Show more

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Cited by 15 publications
(11 citation statements)
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“…Low-loss EEL spectra from the etched surfaces also reveal the presence of a signal at~13.8 eV ( Supplementary Fig. 6) that is similar to a signal which has been previously associated with zigzag edges in MoS 2 33 . TEM images reveal that a thin layer (0-3 nm) of amorphous material occasionally appears on top of the etched zigzag surfaces ( Fig.…”
Section: Resultssupporting
confidence: 73%
“…Low-loss EEL spectra from the etched surfaces also reveal the presence of a signal at~13.8 eV ( Supplementary Fig. 6) that is similar to a signal which has been previously associated with zigzag edges in MoS 2 33 . TEM images reveal that a thin layer (0-3 nm) of amorphous material occasionally appears on top of the etched zigzag surfaces ( Fig.…”
Section: Resultssupporting
confidence: 73%
“…Specifically, these materials exhibit numerous remarkable electronic and optical properties thanks to their broken inversion symmetry. [4][5][6] Significant attention has been recently devoted to their nonlinear optical response, [7][8][9] which makes TMDs ideal building blocks for ultra-thin 10 nonlinear photonic devices. 11 Such nonlinear optical effects have been demonstrated in horizontal MoS 2 (h-MoS 2 ) monolayers, displaying a marked dependence on the specific crystalline symmetry and orientation.…”
Section: Introductionmentioning
confidence: 99%
“…9,10,11 However, exfoliation limits the available inspection area since in general the totality of material cannot be transferred. In the case of outof-plane cross-sections, these are usually prepared using focus ion beam (FIB), 12,13 which again often results in small inspections areas.…”
Section: Introductionmentioning
confidence: 99%