1998
DOI: 10.30970/jps.02.362
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Metal–insulator transition in narrow-band model with non-equivalent Hubbard sub-bands

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Cited by 3 publications
(7 citation statements)
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“…Thus both orbital degeneracy and correlated hopping are the factors favoring the transition of system to an insulating state in the case of half-filling with the increase of intra-atomic Coulomb repulsion in comparison with the single-band Hubbard model (in this connection see Refs. [35,37]).…”
Section: Discussionmentioning
confidence: 99%
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“…Thus both orbital degeneracy and correlated hopping are the factors favoring the transition of system to an insulating state in the case of half-filling with the increase of intra-atomic Coulomb repulsion in comparison with the single-band Hubbard model (in this connection see Refs. [35,37]).…”
Section: Discussionmentioning
confidence: 99%
“…MIT in a generalized Hubbard model with correlated hopping has been studied in a number of recent works [29][30][31][32][33][34][35][36][37][38]. In particular, at half-filling and t 0 = −X (or t AB = 0) some exact results have been found [29,[32][33][34].…”
Section: Introductionmentioning
confidence: 99%
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“…For an arbitrary t ′ = 0 (or t AB = 0) the finding of MIT criterion and the description of this phenomenon in a generalized Hubbard model with correlated hopping still remain an open problem. One of the step to solve this task is recent papers [18,19,22]- [25] where criteria of MIT, ground state energy, concentration of doubly occupied sites have been found. In Refs.…”
Section: Model Hamiltonianmentioning
confidence: 99%
“…On the basis of an approach proposed in the papers [3,19] we have studied metal-insulator transition in a model of narrow-band material with non-equivalent Hubbard subbands (so-called "non-symmetric Hubbard model") at half-filling and zero temperature in the paper [20]. The present paper is devoted to a further study of metal-insulator transition in a model with non-equivalent Hubbard subbands, in particular, an investigation of temperature-induced metal-to-insulator transition.…”
Section: Introductionmentioning
confidence: 99%