Insulator-to-metal (MI) phase transition in vanadium dioxide (VO 2 ) thin films with controlled lattice distortion was investigated by thermopower measurements. VO 2 epitaxial films with different crystallographic orientations, grown on (0001) α-Al 2 O 3 , (1120) α-Al 2 O 3 , and (001) TiO 2 substrates, showed significant decrease of absolute value of Seebeck coefficient (S) from ∼200 to 23 μV K −1 , along with a sharp drop in electrical resistivity (ρ), due to the transition from an insulator to a metal. The MI transition temperatures observed both in ρ(T ρ ) and S(T S ) for the VO 2 films systematically decrease with lattice shrinkage in the pseudorutile structure along the c axis, accompanying a broadening of the MI transition temperature width. Moreover, the onset T S , where the insulating phase starts to become metallic, is much lower than the onset T ρ . This difference is attributed to the sensitivity of S for the detection of hidden metallic domains in the majority insulating phase, which cannot be detected in ρ measurements. Consequently, S measurements provide a straightforward and excellent approach for a deeper understanding of the MI transition process in VO 2 .