2020
DOI: 10.1016/j.spmi.2020.106467
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Metal-insulator-semiconductor structure for deep-ultraviolet light-emitting diodes to increase the electron injection in the cathode region

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Cited by 3 publications
(2 citation statements)
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“…In addition, Shao et al improved the WPE of AlGaN-based DUV LEDs and reduced the contact resistance by adopting the metal-insulator-semiconductor (MIS) structure on the n-AlGaN layer [113]. As shown in Figure 9, the MIS structure can make the electron affinity band of a cathode metal higher than the conduction band of the n-AlGaN layer, which is conducive to the intraband tunneling effect of electrons.…”
Section: Increase the Wall-plug Efficiency Of Duv Ledsmentioning
confidence: 99%
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“…In addition, Shao et al improved the WPE of AlGaN-based DUV LEDs and reduced the contact resistance by adopting the metal-insulator-semiconductor (MIS) structure on the n-AlGaN layer [113]. As shown in Figure 9, the MIS structure can make the electron affinity band of a cathode metal higher than the conduction band of the n-AlGaN layer, which is conducive to the intraband tunneling effect of electrons.…”
Section: Increase the Wall-plug Efficiency Of Duv Ledsmentioning
confidence: 99%
“…Φ R and Φ i stand for the barrier height for reference LED and different MIS-structured LEDs, respectively. Reproduced from Ref [113]. with permission from Elsevier.…”
mentioning
confidence: 99%