2013
DOI: 10.1021/nn4052138
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Metal Contacts on Physical Vapor Deposited Monolayer MoS2

Abstract: The understanding of the metal and transition metal dichalcogenide (TMD) interface is critical for future electronic device technologies based on this new class of two-dimensional semiconductors. Here, we investigate the initial growth of nanometer-thick Pd, Au, and Ag films on monolayer MoS2. Distinct growth morphologies are identified by atomic force microscopy: Pd forms a uniform contact, Au clusters into nanostructures, and Ag forms randomly distributed islands on MoS2. The formation of these different int… Show more

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Cited by 281 publications
(299 citation statements)
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“…Such approaches may, for example, be relevant for achieving 2D metal film growth on 2D crystals, including graphene and Mo 2 S, and thereby synthesize low-resistivity electrical contacts on nanoelectronic devices [4,5,[7][8][9][10][11][12][13][14] or fabricate catalytic devices that exhibit enhanced turnover frequencies [6].…”
Section: Discussionmentioning
confidence: 99%
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“…Such approaches may, for example, be relevant for achieving 2D metal film growth on 2D crystals, including graphene and Mo 2 S, and thereby synthesize low-resistivity electrical contacts on nanoelectronic devices [4,5,[7][8][9][10][11][12][13][14] or fabricate catalytic devices that exhibit enhanced turnover frequencies [6].…”
Section: Discussionmentioning
confidence: 99%
“…A notable example is the deposition of metal films on twodimensional (2D) crystals (e.g., graphene and MoS 2 ) [4][5][6] for which the tendency toward the formation of 3D agglomerates imposes technological obstacles for the use of 2D materials in a wide range of switching and, in some cases, catalytic devices [4][5][6][7][8][9][10][11][12][13][14]. Thus, understanding atomistic mechanisms that govern 3D island formation and shape evolution is a key step toward controlling film morphology and, by extension, the functionality of devices based on weakly interacting film/substrate materials systems.…”
Section: Introductionmentioning
confidence: 99%
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“…Raman mapping (Fig. 3e,f) was used to confirm that the Raman spectrum was uniform over the monolayer region as well as distinct from the spectra associated with multilayer regions and the substrate [25][26][27] (Maps of Raman peak positions are also shown in Supplementary Fig 8.). We performed PL and reflection measurements to confirm that the existence of a direct bandgap, which is known to be characteristic of monolayer MoS 2 (refs 28-31).…”
Section: Growth Processmentioning
confidence: 99%
“…The drain–source current is controlled by the gate voltage on the dielectric layer. High carrier mobility, high switching ratio and low subthreshold swing means high performance FET, which depends on the metal contacts,247 channel materials (thickness,248, 249 doping,192, 250, 251, 252, 253, 254 heterostructures200, 208), dielectric materials (back‐gate,86, 255 top‐gate,256 liquid gate257), and so forth. 2D GIVMCs based FETs have demonstrated exciting performance.…”
Section: Device Applicationsmentioning
confidence: 99%