2016
DOI: 10.1063/1.4963719
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Mesoscopic current transport in two-dimensional materials with grain boundaries: Four-point probe resistance and Hall effect

Abstract: Anomalous Hall resistivity due to grain boundary in manganite thin films J. Appl. Phys. 93, 8107 (2003) We have studied the behavior of micro four-point probe (M4PP) measurements on two-dimensional (2D) sheets composed of grains of varying size and grain boundary resistivity by Monte Carlo based finite element (FE) modelling. The 2D sheet of the FE model was constructed using Voronoi tessellation to emulate a polycrystalline sheet, and a square sample was cut from the tessellated surface. Four-point resistance… Show more

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Cited by 9 publications
(9 citation statements)
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“…In contrast, a M4PP measurement with 300 μm probe pitch (see illustration in Supporting Information Figure S1) is measuring the 2D conductance, which is highly sensitive to any obstructions of the current flow, and only identical to the 2D conductivity for a perfectly uniform conducting film of constant thickness. 24,28,29 CLSM, KPFM, and Raman spectroscopic mapping were carried out in all three regions, R1, R2, and R3, to further understand the differences in σ dc observed in Figure 1. The CLSM images reveal clear topographical differences between the three regions as shown in Figure 2a−c.…”
Section: ■ Results and Discussionmentioning
confidence: 81%
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“…In contrast, a M4PP measurement with 300 μm probe pitch (see illustration in Supporting Information Figure S1) is measuring the 2D conductance, which is highly sensitive to any obstructions of the current flow, and only identical to the 2D conductivity for a perfectly uniform conducting film of constant thickness. 24,28,29 CLSM, KPFM, and Raman spectroscopic mapping were carried out in all three regions, R1, R2, and R3, to further understand the differences in σ dc observed in Figure 1. The CLSM images reveal clear topographical differences between the three regions as shown in Figure 2a−c.…”
Section: ■ Results and Discussionmentioning
confidence: 81%
“…THz-TDS is sensitive to the nanoscopic conductivity averaged over a length scale corresponding to the characteristic distance traversed by an electron during one cycle of the alternating THz field, which is on the order of 10–100 nm. , Given that the spot size of the THz beam is ∼350 μm, the measured values of the conductivity can be considered as the average of all 10–100 nm interaction regions across the beam spot, which is essentially the averaged conductivity. In contrast, a M4PP measurement with 300 μm probe pitch (see illustration in Supporting Information Figure S1) is measuring the 2D conductance, which is highly sensitive to any obstructions of the current flow, and only identical to the 2D conductivity for a perfectly uniform conducting film of constant thickness. ,, …”
Section: Resultsmentioning
confidence: 85%
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“…Moreover, STP has received interest from theory in recent years. More recent approaches consider graphene‐specific geometries and defects and extend general treatments that were started over two decades ago …”
Section: Theoretical Introduction To Localized Voltage Drops In 2dmentioning
confidence: 99%
“…It is well known that the experimental measurements of electrical conductivity are not so complicated; this is done with a four-point method to measure the sheet resistivity or conductivity [1,2]. However, making a theoretical estimate of the electrical conductivity requires complicated mathematical elements, e.g., Lippmann-Schwinger equation [3,4].…”
Section: Introductionmentioning
confidence: 99%