2014
DOI: 10.1007/978-3-7091-0706-5
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MEMS Product Engineering

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Cited by 7 publications
(14 citation statements)
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“…6). Such a simultaneous occurrence of incommensurability in the magnetic channel and a deformation of the fermion-boson vertex in the Cooper channel has already been observed in the one-band (t, t ′ ) Hubbard model 42 and may be explained as follows. Consider a singlet Copper pair with momenta (k, −k) scattered to (k ′ , −k ′ ) by the interaction in the Cooper channel which shall be mimicked by a one-loop particle-particle diagram with two spin-channel vertices.…”
Section: B Doping Dependencementioning
confidence: 64%
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“…6). Such a simultaneous occurrence of incommensurability in the magnetic channel and a deformation of the fermion-boson vertex in the Cooper channel has already been observed in the one-band (t, t ′ ) Hubbard model 42 and may be explained as follows. Consider a singlet Copper pair with momenta (k, −k) scattered to (k ′ , −k ′ ) by the interaction in the Cooper channel which shall be mimicked by a one-loop particle-particle diagram with two spin-channel vertices.…”
Section: B Doping Dependencementioning
confidence: 64%
“…Note that, close to the transition from d x 2 −y 2 -wave SC to ferromagnetism in the one-band Hubbard model, this resolution would be still too coarse in the fermionic momenta. 42 For the parameters considered in this work, however, we are far away from such a transition and a deformation of the form factors at low energies should at least qualitatively be captured within our approach.…”
Section: B Channel Decompositionmentioning
confidence: 94%
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“…Therefore the computer assisted analysis of simulation results based on modelling is so important to reduce time and costs of technology development [8][9][10]. (225) Typical ion implantation processes are performed at room temperature, but high fluences of implanted ions (above 10 16 cm −2 ) result in high radiation damage hard to recover even under high temperature postimplantation annealing process (PIA).…”
Section: Modelling Of Aluminum Implantationmentioning
confidence: 99%