AIAA Infotech@Aerospace Conference 2009
DOI: 10.2514/6.2009-1905
|View full text |Cite
|
Sign up to set email alerts
|

MEMS Pressure Sensor Array for Aeroacoustic Analysis of the Turbulent Boundary Layer

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

0
5
0

Year Published

2012
2012
2014
2014

Publication Types

Select...
2
1

Relationship

1
2

Authors

Journals

citations
Cited by 3 publications
(5 citation statements)
references
References 10 publications
0
5
0
Order By: Relevance
“…Laser vibrometer measurements shown elsewhere [10] indicate that the first resonant frequency of the microphone is greater than 400 kHz, suggesting that the microphones can be used at frequencies up to 400 kHz, although this has not been confirmed by acoustic calibration. The bandwidth of the electronics sets the upper limit of operation of the current system at 40 kHz, although this could be increased with minor changes to the electronics.…”
Section: Calibrationmentioning
confidence: 93%
See 3 more Smart Citations
“…Laser vibrometer measurements shown elsewhere [10] indicate that the first resonant frequency of the microphone is greater than 400 kHz, suggesting that the microphones can be used at frequencies up to 400 kHz, although this has not been confirmed by acoustic calibration. The bandwidth of the electronics sets the upper limit of operation of the current system at 40 kHz, although this could be increased with minor changes to the electronics.…”
Section: Calibrationmentioning
confidence: 93%
“…Nano Fabrication Facility. Fabrication has been described previously [10,11]. Briefly, fabrication begins at Memscap by first depositing the silicon nitride isolation layer, then depositing and patterning of the 600 nm thick polysilicon lower electrode and interconnect layer (Poly0).…”
Section: Design and Fabricationmentioning
confidence: 99%
See 2 more Smart Citations
“…In addition, for large arrays of MEMS microphones, yield issues were dominated by wire bond integrity problems. These two issues were the primary motivation for developing the low profile conductive ink process [4].…”
Section: Introductionmentioning
confidence: 99%