2013
DOI: 10.1063/1.4775673
|View full text |Cite
|
Sign up to set email alerts
|

Memory diodes with nonzero crossing

Abstract: Memristors combine switching, memory, and rectification functions in two-terminal nanoelectronic devices. The theory says that their current-voltage (I-V) characteristics cross over at the zero crossing point (I = V = 0), and the results reported hitherto conform to this theorem. Here, we extend the family of memristive devices, adding memory diodes (memdiodes) comprising SrTiO3 pn junctions that display unique combination of rectification, hysteresis, and nonzero crossing. Reverse bias polarization gives rise… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

3
25
0

Year Published

2014
2014
2023
2023

Publication Types

Select...
6

Relationship

1
5

Authors

Journals

citations
Cited by 27 publications
(28 citation statements)
references
References 26 publications
3
25
0
Order By: Relevance
“…Reproduced with permission. [ 6 ] Copyright 2013, American Institute of Physics. [22] Work function of the left contact ϕ M …”
Section: Model Calculationsmentioning
confidence: 98%
See 3 more Smart Citations
“…Reproduced with permission. [ 6 ] Copyright 2013, American Institute of Physics. [22] Work function of the left contact ϕ M …”
Section: Model Calculationsmentioning
confidence: 98%
“…Although the I -V curves in Figure 1 were measured through a junction between a Fe:STO fi lm and a Nb:STO substrate, [ 6 ] the latter is modeled here as a metallic Schottky contact due to the high donor concentration in Nb:STO. The work function of this contact was found by fi tting the steady-state I -V curve in Figure 1 (black squares) with model calculations as described below, yielding a value of 4.3 eV (see Table 1 ).…”
Section: Model Calculationsmentioning
confidence: 99%
See 2 more Smart Citations
“…Metal/oxide/metal resistive switching devices are reported to show a voltage-switching behavior originating from electrochemical reactions in the device. [12][13][14] Such voltage switching is observed both in filament- 12,13 and interface-type 12,14 resistive switching devices. For the filament-type device, previous reports showed instability in performance.…”
mentioning
confidence: 99%