Abstract:A medium to high energy x-ray diffractometer, based on commercial components, is described. The performances of such an instrument in investigating relatively thick crystalline samples are exploited. Results of test measurements, among which is the characterization of a single crystal of Ge as thick as 1 cm, are reported.
Set email alert for when this publication receives citations?
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.