Medición de desplazamientos nanométricos en polímeros piezoeléctricos usando método de descomposición en modos empíricos bivariados en patrones de speckle
Abstract:In this work we present an optical method for the direct determination of the piezoelectric coefficient of polymeric thin films. This is achieved through the measurement of nanometric mechanical displacements generated in the film when it is excited by low frequency harmonic electrical signals (0.5 Hz). The system is based on the temporal speckle pattern interferometry technique and the recovery of phase by using a bivariate empirical mode decomposition framework. The experimental scheme was used on a sample o… Show more
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