2020
DOI: 10.1016/j.microrel.2020.113917
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Mechanistic study of copper wire-bonding failures on packaging devices in acidic chloride environments

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Cited by 15 publications
(16 citation statements)
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References 19 publications
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“…This was accompanied by hydrogen gas evolution (confirmed by GC-MS, in Fig. 4 ) [7] . Since the corrosion mechanism of the microdot platform replicates that of the real wire bond device in immersion screenings, the microdots can be used in place of real devices when exploring the use of different corrosion inhibitors and the effects of different contaminants within solution.…”
Section: Methods Detailsmentioning
confidence: 76%
“…This was accompanied by hydrogen gas evolution (confirmed by GC-MS, in Fig. 4 ) [7] . Since the corrosion mechanism of the microdot platform replicates that of the real wire bond device in immersion screenings, the microdots can be used in place of real devices when exploring the use of different corrosion inhibitors and the effects of different contaminants within solution.…”
Section: Methods Detailsmentioning
confidence: 76%
“…Lim et al [ 76 ] found in their study on Cu, Al, and Cu-Al IMCs that the corrosion current of IMCs in a 25 ppm chloride solution at pH 6 increased with an increase in Al content. Nick Ross et al [ 77 ] made new findings regarding this corrosion behavior: (1) the cathodic half-cycle of corrosion was initially supported by the reduction in dissolved oxygen and later taken over by hydrogen evolution during the late stages of acute Al pad corrosion. (2) Hydrogen evolution was identified as part of the cathodic reaction causing Cu wire separation during the corrosion of Al pads under acidic chloride conditions.…”
Section: Bonding Reliabilitymentioning
confidence: 99%
“…As a result, it has been concluded that it is better to replace the copper used for wiring harnesses with aluminum alloys to beat fatigue and corrosion. Ross et al (2020) developed a new strategy for preventing corrosion based on recently discovered mechanistic insights into corrosion prevention. It has been established that early testing runs can reduce the faults due to reliability requirements, which are necessary for self-driving vehicles and wearable electronics and microelectronics.…”
Section: Introductionmentioning
confidence: 99%