Recent Trends in Radiation Chemistry 2010
DOI: 10.1142/9789814282093_0018
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Mechanisms of Radiation-Induced DNA Damage: Direct Effects

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Cited by 29 publications
(76 citation statements)
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“…Furthermore, we note here that formation of C3' dephos • has been reported to occur via dissociative electron attachment owing to the attack of low energy electron (LEE) at the DNA sugar phosphate C3'-O bond (Becker et al 2003, 2007, 2010a, 2010b) and supported by product analyses in LEE (4 to 15 electron volt (eV))-induced damaged oligomers (Li et al 2008). On the other hand, this work provides the first evidence of distinct line components owing to C3' dephos • production via excited one-electron oxidized base radicals.…”
Section: Resultssupporting
confidence: 65%
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“…Furthermore, we note here that formation of C3' dephos • has been reported to occur via dissociative electron attachment owing to the attack of low energy electron (LEE) at the DNA sugar phosphate C3'-O bond (Becker et al 2003, 2007, 2010a, 2010b) and supported by product analyses in LEE (4 to 15 electron volt (eV))-induced damaged oligomers (Li et al 2008). On the other hand, this work provides the first evidence of distinct line components owing to C3' dephos • production via excited one-electron oxidized base radicals.…”
Section: Resultssupporting
confidence: 65%
“…91 G). Our work (Adhikary et al 2008; Becker et al 2010a,b) have shown that the β-proton HFCC values for C3′• ranges from ca. 84 to ca.…”
Section: Resultsmentioning
confidence: 83%
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