Mechanisms of Initiation of Unstable Latchup Effects in CMOS ICs

Chumakov, A. I.; Bobrovsky, Dmitry V.; Pechenkin, Alexander; Savchenkov, D. V.; Sorokoumov, Georgy S.; Shvetsov-Shilovskiy, Ivan I.

doi:10.1134/s1063739719040036

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Mechanisms of Initiation of Unstable Latchup Effects in CMOS ICs

Cited by 3 publications

References 4 publications

Probabilistic Approach to Determining the Transient Upset Level of Digital Integrated Circuits

Probabilistic Approach to Determining the Transient Upset Level of Digital Integrated Circuits

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