2013
DOI: 10.1007/978-94-007-6919-9_2
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Mechanical Property Mapping at the Nanoscale Using PeakForce QNM Scanning Probe Technique

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Cited by 198 publications
(263 citation statements)
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“…The calibration process was performed using the absolute method and was checked through the relative method as recommended by the supplier. 15 UV-vis spectra were obtained using a Perkin-Elmer Lambda 6 UV/Vis spectrophotometer. X-ray diffraction studies were Current density-voltage (J-V) measurements were carried out using a Keithley 2400 source unit.…”
Section: Photoactive Film Preparationmentioning
confidence: 99%
“…The calibration process was performed using the absolute method and was checked through the relative method as recommended by the supplier. 15 UV-vis spectra were obtained using a Perkin-Elmer Lambda 6 UV/Vis spectrophotometer. X-ray diffraction studies were Current density-voltage (J-V) measurements were carried out using a Keithley 2400 source unit.…”
Section: Photoactive Film Preparationmentioning
confidence: 99%
“…Force distance curves (force curves) are acquired to obtain information about mechanical properties and interparticulate interactions ( Fig. 2) (Pittenger et al, 2010). Initially, the movement of the z-piezo and the deflection of the cantilever are recorded over time.…”
Section: Mechanical Propertiesmentioning
confidence: 99%
“…Highly developed software programmes allow the conversion of the measured deflection into force ( Fig. 2a and b) (Pittenger et al, 2010). For interpretation purposes, the force is then plotted against the separation between the tip of the probe and the sample surface which is derived from the position of the z-piezo ( Fig.…”
Section: Mechanical Propertiesmentioning
confidence: 99%
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“…As a remedy nonresonant tapping mode techniques are used. Thus, AFM with low frequency excitation compared to the fundamental natural frequency of the cantilever is used, for instance, in the pulsed-force mode AFM [11] and the peak-force AFM [12]. Indeed, the low frequency excitation leads to lower the tapping force causing limited tip-sample contact areas and minimizing the loss of resolution.…”
Section: Introductionmentioning
confidence: 99%