Mechanical Properties of Nanoparticle Chain Aggregates by Combined AFM and SEM:  Isolated Aggregates and Networks

Rong, Weizhi; Ding, Weiqiang; Mädler, Lutz; Ruoff, Rodney S.; Friedlander, Sheldon K.

doi:10.1021/nl061146k

Cited by 45 publications

(38 citation statements)

References 46 publications

(106 reference statements)

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“…Friedlander studied the mechanical behavior of nanoparticle agglomerates under strain with an AFM. 35,36 In a recent study, we pursued these investigations by detailed analyses of the measured forces. We showed that penetrating highly porous nanoparticle agglomerates with an AFM-tip is a reliable technique to measure contact forces directly between two individual nanoparticles.…”

Section: Introductionmentioning

confidence: 99%

Contact Forces between Single Metal Oxide Nanoparticles in Gas-Phase Applications and Processes

Salameh¹,

Veen²,

Kappl

et al. 2017

Langmuir

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In this work we present a comprehensive experimental study to determine the contact forces between individual metal oxide nanoparticles in the gas-phase using atomic force microscopy. In addition, we determined the amount of physisorbed water for each type of particle surface. By comparing our results with mathematical models of the interaction forces, we could demonstrate that classical continuum models of van der Waals and capillary forces alone cannot sufficiently describe the experimental findings. Rather, the discrete nature of the molecules has to be considered, which leads to ordering at the interface and the occurrence of solvation forces. We demonstrate that inclusion of solvation forces in the model leads to quantitative agreement with experimental data and that tuning of the molecular order by addition of isopropanol vapor allows us to control the interaction forces between the nanoparticles.

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Section: Introductionmentioning

confidence: 99%

Contact Forces between Single Metal Oxide Nanoparticles in Gas-Phase Applications and Processes

Salameh¹,

Veen²,

Kappl

et al. 2017

Langmuir

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“…[5][6][7][8] As the sizes of MEMS approach nanoelectromechanical systems (NEMS), [9] exploration of the changes of mechanical properties on the nanometer scale is vitally important. [10][11][12][13][14][15] Silicon nanowires (NWs) are the key building blocks of future electronics. [16] Several approaches have been developed to study the mechanical behavior of Si nanowires.…”

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confidence: 99%

Elastic Properties and Buckling of Silicon Nanowires

et al. 2008

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The ultrahigh flexibility and strong mechanical toughness of silicon nanowires (SiNWs) is demonstrated using manipulation and measurements on buckled SiNWs in a scanning electron microscope (see figure). The experimental data and calculated results show that the nanowire can bear a large strain (1.5%), much more than the bulk material, while the elastic constant of the NW is similar to that of the bulk.

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“…Alternatively, the xAFM may be regarded as an advanced SEM/transmission electron microscope (TEM)-based manipulator. [11][12][13] In particular, the popular SEM manipulators currently used often handle two objects or probes in a similar fashion, as well as in a similar environment. In the simple arrangement, however, the tipsample distance is adjusted by the operator based upon SEM images.…”

Section: Discussionmentioning

confidence: 99%

Cross-sectional atomic force microscope in scanning electron microscope

Park

Song

Kim

et al. 2014

Journal of Vacuum Science &Amp; Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phen

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A newly designed atomic force microscope (referred to as “cross-sectional AFM” or “xAFM”) is demonstrated that enables tip–sample interactions to be studied directly from a cross-sectional scanning electron microscope (SEM) view during AFM operation. Previously, such interactions have only been modeled using computer simulations or sensor-generating data. The xAFM will allow researchers to acquire additional visual information not available with conventional microscopic techniques. The xAFM is operated in a tungsten filament SEM, by examining a grating sample that is cleaved and mounted on the sample scanner so that the cleaved cross section faces upwards toward the bottom of the electron column. The tip scans horizontally, parallel to and at a height slightly lower than the cross-sectional surface of the sample but within the depth of focus of the SEM. Three experiments are described that show the unique features of the xAFM. The first demonstrates direct observation of the “tip-convolution” in real-time SEM images. The second shows unambiguous identification of an artifact in the lateral force microscope, from which a “double dip” appears in the signal from a damaged tip in a backward scan of the grating surface. The third enables measurements from blurred SEM images of large-amplitude oscillating high-Q AFM cantilevers in vacuum.

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Mechanical Properties of Nanoparticle Chain Aggregates by Combined AFM and SEM: Isolated Aggregates and Networks

Cited by 45 publications

References 46 publications

Contact Forces between Single Metal Oxide Nanoparticles in Gas-Phase Applications and Processes

Contact Forces between Single Metal Oxide Nanoparticles in Gas-Phase Applications and Processes

Elastic Properties and Buckling of Silicon Nanowires

Cross-sectional atomic force microscope in scanning electron microscope

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