Mechanical Mapping of Nanoblisters Confined by Two-Dimensional Materials Reveals Complex Ridge Patterns
Chengfu Ma,
Xu Yang,
Yuhang Chen
et al.
Abstract:Understanding the mechanics of blisters confined by two-dimensional (2D) materials is of great importance for either fundamental studies or for their practical applications. In this work, we investigate the mechanical properties of nanoscale 2D material blisters using contact-resonance atomic force microscopy (CR-AFM). From the measurement results at the blister centers, the blisters' internal pressures are characterized, which are shown to be inversely proportional to the blisters' sizes. Our measurements agr… Show more
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