DOI: 10.1007/978-3-540-85037-3_3
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Mechanical Diode-Based Ultrasonic Atomic Force Microscopies

Abstract: Abstract. Recent advances in mechanical diode-based ultrasonic force microscopy techniques are reviewed. The potential of Ultrasonic Force Microscopy (UFM) for the study of material elastic properties is explained in detail. Advantages of the application of UFM in nanofabrication are discussed. Mechanical-Diode Ultrasonic Friction Force Microscopy (MD-UFFM) is introduced, and compared with Lateral Acoustic Force Microscopy (LAFM) and Torsional Resonance (TR) -Atomic Force Microscopy (AFM). MD-UFFM provides a n… Show more

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Cited by 7 publications
(8 citation statements)
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References 79 publications
(172 reference statements)
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“…The ultrasonic vibrations applied (~2 MHz) are well above the resonance frequency of CM cantilevers (tens of kHz); hence the cantilever is not be able to linearly follow the surface vibration because of its inertia [50]. If the ultrasonic excitation amplitude is sufficiently high, the tip-sample distance is modulated within the nonlinear tip-sample force interaction regime and the cantilever experiences of an additional static force [51]. This static force causes an additional deflection to the cantilever (UFM signal) with a magnitude that depends on the details of the tip-sample interaction force, i.e.…”
Section: Scanning Probe Microscopies Characterizations Of Organic Filmsmentioning
confidence: 99%
“…The ultrasonic vibrations applied (~2 MHz) are well above the resonance frequency of CM cantilevers (tens of kHz); hence the cantilever is not be able to linearly follow the surface vibration because of its inertia [50]. If the ultrasonic excitation amplitude is sufficiently high, the tip-sample distance is modulated within the nonlinear tip-sample force interaction regime and the cantilever experiences of an additional static force [51]. This static force causes an additional deflection to the cantilever (UFM signal) with a magnitude that depends on the details of the tip-sample interaction force, i.e.…”
Section: Scanning Probe Microscopies Characterizations Of Organic Filmsmentioning
confidence: 99%
“…To implement UFM, a standard commercial AFM (NANOTEC) was appropriately modified [2,4]. Data acquisition and analysis were carried out using the WSxM software [24].…”
Section: -Materials and Methodsmentioning
confidence: 99%
“…Ultrasonic Force Microscopy (UFM) is a powerful technique to investigate the elastic and adhesive response of materials on the nanoscale [1,2]. The procedure is capable to provide material contrast in both soft and hard samples, bringing additional advantages when compared with other Scanning Probe Microscopy (SPM) approaches [3][4][5][6].…”
Section: -Introductionmentioning
confidence: 99%
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“…To this purpose, a series of physico-chemical techniques [ 6 ] such as X-ray diffraction (XRD), small-angle X-ray scattering (SAXS), and Fourier-transformed infrared spectroscopy (FT-IR) have been applied to the films’ characterization. Contact-angle studies have also been performed, and particular attention has been devoted to the investigation of the films using atomic force microscopy (AFM)-based procedures, including ultrasonic force microscopy (UFM), which is a relatively new technique, extremely powerful for mapping surface and subsurface stiffness inhomogeneities [ 7 , 8 , 9 ].…”
Section: Introductionmentioning
confidence: 99%