Abstract:This paper reports on the strain rate dependence of the mechanical properties of aluminum-based metallization layers. Evaporated Al, sputtered Al 99% Cu 1% , and multilayers of µm-thick Al 99% Cu 1% films separated by thinner TiN/Ti layers are characterized using the bulge test, the microcompression method and the microtensile technique. Elastic, ductile and fracture parameters are extracted for strain rates dε/dt between 10 -4 to 10 1 s -1 . The Young's modulus E of sputtered layers, 59 GPa, is marginally low… Show more
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