2016 14th International Baltic Conference on Atomic Layer Deposition (BALD) 2016
DOI: 10.1109/bald.2016.7886524
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Measuring the thickness of ALD-fabricated thin films by small-angle X-ray scattering

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“…Given that the equilibrium constant K c is defined as the ratio k 1 / k 2 , it is also possible to estimate the constants k 1 and k 2 [ 33 ].…”
Section: Resultsmentioning
confidence: 99%
“…Given that the equilibrium constant K c is defined as the ratio k 1 / k 2 , it is also possible to estimate the constants k 1 and k 2 [ 33 ].…”
Section: Resultsmentioning
confidence: 99%