2007
DOI: 10.2528/pier07080201
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Measuring the Permittivity of Dielectric Materials Using STDR Approach

Abstract: Abstract-This paper presents a new approach for measuring dielectric properties of materials. The proposed approach is based on applying the synthetic time domain reflectometry to a dielectric filled waveguide. The compromising measurement results show that this algorithm can be successfully applied for measuring other parameters of the materials. Also, the approach has been successfully applied to detect the discontinuities of as a multi-section microstrip line. This approach is very useful in measuring the e… Show more

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Cited by 19 publications
(14 citation statements)
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“…It should be noted that in study [11] On the other hand, the experimental validation remains very limited by the available techniques for measuring the electromagnetic properties of human tissues, even though lately some approaches have been developed for measurement of permittivity of complex tissues that might be used, to some extent, and for biological tissues [21][22][23][24][25].…”
Section: Ghzmentioning
confidence: 99%
“…It should be noted that in study [11] On the other hand, the experimental validation remains very limited by the available techniques for measuring the electromagnetic properties of human tissues, even though lately some approaches have been developed for measurement of permittivity of complex tissues that might be used, to some extent, and for biological tissues [21][22][23][24][25].…”
Section: Ghzmentioning
confidence: 99%
“…Pulse propagation in inhomogeneously filled guides has received far less attention [9,10], even though partially-filled guides are often used for determining the constitutive parameters of material samples [11][12][13][14][15]. Recently, Moradi and Abtipour [16] proposed using time-domain methods to extract the material parameters of waveguide samples. Such approaches require an understanding of the interaction of propagating transient fields with the interfaces between differing materials.…”
Section: Introductionmentioning
confidence: 99%
“…Transmission-reflection and reflection-only non-resonant methods have been widely utilized for characterization of materials owing to their relative simplicity, broad frequency coverage, and higher accuracy [1][2][3][4][5][6][7][8][9][10][11][12][13][14]. There are few problems of these methods such as undesired ripples in the measured parameters, the increased uncertainty in referenceplane positions, and multiple solutions for electromagnetic parameters.…”
Section: Introductionmentioning
confidence: 99%