2018 19th International Symposium on Quality Electronic Design (ISQED) 2018
DOI: 10.1109/isqed.2018.8357281
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Measuring the effectiveness of ISO26262 compliant self test library

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Cited by 9 publications
(3 citation statements)
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“…In other cases users resort to functional solutions, e.g. based on the so-called Self-Test Libraries [38], which rely on the Software-based Self-test approach [39], [40]. This solution seems particularly effective for in-field test of complex systems, since it allows to exploit self-test code provided by the developer of the modules composing the system and able to achieve a given fault coverage, which is integrated by the user into the application code and run when required to achieve the target reliability figures (e.g., at the Power-On, or periodically, or when specific error conditions happen).…”
Section: Reliability Enhancementmentioning
confidence: 99%
“…In other cases users resort to functional solutions, e.g. based on the so-called Self-Test Libraries [38], which rely on the Software-based Self-test approach [39], [40]. This solution seems particularly effective for in-field test of complex systems, since it allows to exploit self-test code provided by the developer of the modules composing the system and able to achieve a given fault coverage, which is integrated by the user into the application code and run when required to achieve the target reliability figures (e.g., at the Power-On, or periodically, or when specific error conditions happen).…”
Section: Reliability Enhancementmentioning
confidence: 99%
“…To reduce the impact of safety mechanisms on performance, we propose an approach that exploits the idle time of the CPU to execute test routines, i.e., Self-Test Libraries (STL). Well-established Functional Safety standards, such as ISO 26262, require high coverage of random hardware faults, for which STLs have been identified as an effective safety mechanism, providing high coverage without any impact on the device's design [5]. However, to achieve the target protection level STLs need to stimulate as much as possible the internal logic of the component, imposing a significant overhead on the nominal execution [6].…”
Section: Introductionmentioning
confidence: 99%
“…All the proposed solutions are based on the usage of commercially available EDA tools, thus being easily adoptable by professionals in the field. To the best of our knowledge, with respect to similar works [20], [21], this paper is the first attempt to provide a comprehensive and commented overview about the techniques that can be adopted to effectively perform the fault grading of STLs.…”
Section: Introductionmentioning
confidence: 99%