Measuring the Compression of a Carbon Nanospring

Abstract

The mechanical response of a multiwalled carbon nanospring was examined with an atomic force microscope. Cantilever deflection, oscillation amplitude, and resonance were simultaneously monitored during the cycled movement of the scanner. A nonlinear response of the nanospring was observed, consistent with compression and buckling of the nanospring. This is the first reported measurement of a shift in the cantilever resonance frequency as a result of the interaction of a nanospring-tipped cantilever with the substrate.

Electrical conduction of carbon nanotube atomic force microscopy tips: Applications in nanofabrication

“…By moving the cantilever in Z motion within a defined range around the region of contact, the general nature of tip-substrate interaction can be investigated by monitoring the motion of the cantilever. Previous work has shown the complicated nature of the various mechanical responses of both MWNT [22][23][24] and SWNT 25,26 with AFM force spectroscopy. These studies show the bending, buckling, and slipping motion of the nanotube tips in contact with the surfaces of substrates.…”

Mechanics of Helical Carbon Nanomaterials

“…On this issue, Poggi et al [66] demonstrated that a 1100 nm length of coil could undergo compression/ buckling/decompression repeatedly with a limiting compression of 400 nm. Figure 3.15 presents the cantilever deflection signal observed when a nanospring-tipped cantilever was brought into and out of contact with the gold substrate.…”

“…Scanner movement was large enough to encompass both the compression of the nanosprings and mechanical contact between the silicon cantilever tip and the substrate. The distance between the point of contact [66]. Reproduced with permission of American Chemical Society of the substrate to the nanospring and to the silicon tip is ca.…”

An empirical study of dynamic properties of an individual carbon nanotube electron source system

“…An individual CNT is aligned with and attached to the edge of this Ni-coated Si surface through joule heating. Previously we demonstrated through atomic force microscopy measurements that the CNT to Ni-Si attachment is mechanically stable [6][7][8]. A Ni layer thickness of at least 25 nm is required to guarantee Ohmic contact and electrical stability at the CNT-Si interface [5].…”